Keysight Technologies B1505A

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Keysight B1505A Configuration and Connection Guide 7-53

Connection and Ordering Examples

Configuration Examples for Vertical Device Measurement with Wafer Prober

N1260A 1 High Voltage Bias-Tee

N1260A-STD 1 High Voltage Bias-Tee

16493S 1 High Current Source Monitor Unit Cable

16493S-011 1 High Current Source Monitor Unit non-Kelvin Adapter

N1262A 1 R-box for B1505A

N1262A-010 1 1 kohm R-box for gate (Triaxial output)

N1262A-021 1 Universal R-Box, HV Triaxial to SHV

N1262A-036 1 50 Ohm Termination Adapter

N1254A 1 Accessories for instruments and fixtures

N1254A-104 2 Triax (f) to BNC (m) adapter

N1254A-518 3 SHV Cable 1.5 m

Model/Option Quantity Description

Main Page

Table of Contents5
Measurement Resources11
B1505A Mainframe Furnished Accessories13
B1505A Modules and Mainframe Options15
- Module Type and Locations17
N1259A Test Fixture for Power Device19
N1265A Ultra High Current Expander/Fixture25
N1266A High Voltage Source Monitor Unit Current Expander33
- N1266A Compatibility with Fixture and Module Selector35
Fast Switch37
N1268A Ultra High Voltage Expander39
N1271A Thermal Test Enclosure and Related Accessories43
- Measurement Capability on Thermal Test47
- Information of Intest Thermal Plate and Thermostream47
Modules/Fixture)48
Pre-Configured Power Device Analyzer/Curve Tracer48
Accessories for Wafer Prober and Your Own Test Fixture56
Other Accessories65
Retrofit Products for B1505A69
Conversion Kit from B1500A to B1505A72
Upgrade Kit for N1259AU Test Fixture73
Upgrade Kit for N1265AU Test Fixture77
Note for 4142B Users82
N1259A Connection Guide83
- Input Connection85
  - To Connect Interlock Circuit86
- Output Connection90
N1265A Connection Guide107
- Input Connection110
  - To Connect Interlock Circuit111
- Output Connection115
N1272A and N1273A Connection Guide133
- Input Connection135
  - To Connect Interlock Circuit135
  - N1272A Device Capacitance Selector135
- Output Connection140
Connection Guide for Wafer Prober and Your Own Test Fixture149
- Connection Overview152
- To Connect High Voltage R-Box162
  - To Use Universal R-Box163
- To Connect HCSMU Adapter165
- To Connect Dual HCSMU Adapter168
  - To Connect 16493S-020168
  - To Connect 16493S-021170
- To Connect Protection Adapter171
- To Connect High Voltage Bias Tee173
- To Connect Module Selector175
- To Connect HVSMU/HCSMU Fast Switch180
- To Connect HVSMU Current Expander182
- To Connect Ultra High Current Expander184
  - Connecting System Cable to N1265A185
- To Connect Ultra High Voltage Expander186
- To Connect Device Capacitance Selector188
- To Connect Gate Charge Adapter191
  - To Connect N1274A192
  - To Connect N1275A193
- To Install an Interlock Circuit195
  - Procedure196
  - To Connect Interlock Circuit197
- About Cable Connections198
Accessory Dimensions203
Connection and Ordering Examples219
- Package Device Measurement Configuration Examples221
- Configuration Examples for Lateral Device Measurement with Wafer Prober243
  - Kv, 20 a Measurement for On-Wafer Lateral Device244
- Kv, 20 A, Capacitance Measurement for On-Wafer Lateral Device248
- Add High Resolution Measurement (10 Fa Resolution with MPSMU or HPSMU) Capability to 3 Kv, 20 A, Capacitance Measurement for On-Wafer Lateral Device251
- Kv, 40 a Measurement for On-Wafer Lateral Device253
- Kv, 500 a Measurement for On-Wafer Lateral Device256
- Kv, 500 A, Capacitance Measurement for On-Wafer Lateral Device258
- Lateral Device258
- 10 Kv, 500 a Measurement for On-Wafer Lateral Device262
Configuration Examples for Vertical Device Measurement with Wafer Prober264
- Kv, 20 a Measurement for On-Wafer Vertical Device265
- Kv, 20 A, Capacitance Measurement for On-Wafer Vertical Device269
- Add High Resolution Measurement (10 Fa Resolution with MPSMU or HPSMU) Capability to 3 Kv, 20 A, Capacitance Measurement for On-Wafer Vertical Device272
- Kv, 40 a Measurement for On-Wafer Vertical Device274
- Kv, 500 a Measurement for On-Wafer Vertical Device277
- Kv, 500 A, Capacitance Measurement for On-Wafer Vertical Device278
- Vertical Device278
- 10 Kv, 500 a Measurement for On-Wafer Vertical Device282
Gan Current Collapse / Dynamic On-Resistance Measurement System284
- Non-Kelvin Connection with the N1259A Test Fixture for Package Device284
Using the N1267A284
- Kelvin Connection with the N1259A Test Fixture for Package Device286
- Non-Kelvin Connection with Prober for On-Wafer Lateral Device288
- Kelvin Connection with Prober for On-Wafer Lateral Device290
Upgrading from Existing B1505A292
- Example of How to Upgrade Existing B1505A294

Keysight Technologies B1505A

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