SICK microScan3 Core I/O User Manual

For each field interruption where a safety output switches to the OFF state, the safety
la
ser scanner stores the data from 10 scans. When the internal memory of the safety
laser scanner is full, the scan data of the oldest field interruption is overwritten to store
a new field interruption. The position and time of the field interruption are retained.
The internal memory of the safety laser scanner is emptied when it is restarted.
Data source
•
R
ead from the device: Available only when a device is connected. The data stored
in the device will be read.
•
Load file: You can open a file that stores events that were previously read from a
device.
•
Save Data: You can save the events read from a device to a file for later analysis.
Events
The Events view shows a graphical overview of the interrupts of protection fields, refer‐
ence contours, and contingency identifiers, which have led to a safety output switched
to the OFF state.
•
Navigation: You can select the event whose measurement data is displayed in the
right area.
•
Overview of events: The position of each recorded field interruption relative to the
safety laser scanner is displayed. If you hold the mouse pointer on a position, the
set multiple sampling is displayed. When you click a position, the corresponding
measurement data are displayed in the right-hand area.
•
Measurement data for the selected event: The measurement data of the selected
field interruption is displayed. If multiple scans are stored for the selected field
interruption, you can view the individual scans one by one by clicking the icons
next to Scan.
Event table
T
he event table shows detailed information about the events which have led to a safety
output switching to the OFF state.
Based on the measurement data, a probable cause is assigned to each event:
•
Object: The protective field was probably interrupted by an object.
•
Contour: A reference contour field or a contour identification field has been inter‐
rupted.
•
Contamination: The shutdown was triggered by a soiling of the optics cover in the
area of the protective field.
•
Dazzling: The shutdown was triggered by an external light source in the scan plane
in the area of the protective field, e.g., sun, halogen light, infrared light source,
stroboscope.
•
Near the edge of the field or particles in the field: The protective field was probably
interrupted at the edge or by particles.
Multiple sampling
T
he Multiple sampling view shows how frequently field interruptions with different dura‐
tions have occurred. All interruptions of protective fields, reference contour fields and
contour identification fields are taken into account. Therefore, the number of entries in
this view may deviate from the other views.
The duration is specified as the number of successive scans in which a field is
interrupted. For each duration, the diagram shows the corresponding number of field
interruptions.
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8025870/2020-09-04 | SICK O P E R A T I N G I N S T R U C T I O N S | microScan3 Core I/O
139
Subject to change without notice

SICK microScan3 Core I/O Specifications

General

Brand	SICK
Model	microScan3 Core I/O
Category	Scanner
Language	English