SICK microScan3 Core I/O User Manual

14.5 Course of the OSSD test over time
The safety laser scanner tests the OSSDs at regular intervals. To do this, the safety
la
ser scanner switches each OSSD briefly (for max. 300 μs) to the OFF state and
checks whether this channel is voltage-free during this time.
Make sure that the machine’s control does not react to these test pulses and the
machine does not switch off.
OSSD 1.A
V
t
OSSD 1.B
V
t
t
S
t
S
t
S
t
S
t
S
t
S
t
S
t
S
t
S
Figure 86: Switch-off tests
t
S
Scan cycle time
•
Se
tting “30 ms”: t
S
= 30 ms
•
Setting “40 ms”: t
S
= 40 ms
OSSD 1.A
V
t
OSSD 1.B
V
t
≤ 300
µs
≤ 300
µs
S
4 × t
Figure 87: Duration and time offset for the switch-off tests in an OSSD pair
t
S
Scan cycle time
•
Se
tting “30 ms”: t
S
= 30 ms
•
Setting “40 ms”: t
S
= 40 ms
14.6 Sensing range
Protective field range
T
he effective protective field range depends on the configured scan cycle time and on
the configured object resolution.
Table 34: Protective field range (devices with a max. protective field range of 5.5 m)
Solution Scan cycle time 40 ms Scan cycle time 30 ms
≥ 70 mm 5.50 m 4.00 m
50 mm 3.50 m 3.00 m
40 mm 3.00 m 2.30 m
30 mm 2.30 m 1.70 m
TECHNICAL DATA 14
8025870/2020-09-04 | SICK O P E R A T I N G I N S T R U C T I O N S | microScan3 Core I/O
149
Subject to change without notice

SICK microScan3 Core I/O Specifications

General

Brand	SICK
Model	microScan3 Core I/O
Category	Scanner
Language	English