Need help?Do you have a question about the FEI Scios 2 and is the answer not in the manual?
Provides information for personal safety and maintenance procedures while operating the FEI system.
Describes system capabilities and necessary topics for safe and proper microscope operation.
Details the Scios system as a combination of SEM and FIB, highlighting its integrated functionalities.
Explains the main instrument components used for imaging and their basic functions.
Describes the basic system layout based around the dedicated Microscope PC and optional components.
Details software components, password policy, hardware overview, and power button states.
Defines the different system states: Complete shutdown, Standby, Overnight, and Full operation.
Explains the High Vacuum and Low Vacuum variations and their respective sections and operations.
Covers detector types, applications, stages, and accessories integrated into the system.
Describes icons, tool-tips, menus, command buttons, property editor, edit boxes, and radio buttons.
Explains the server application that starts and stops microscope functions and the user interface.
Details the user interface elements like menu bar, toolbar, imaging area, and control pages.
Covers settings for movie, alignments, magnification, sensitivity, scanning, presets, units, general, and low vacuum.
Explains how to organize user accounts, create/remove accounts, and manage settings and passwords.
Summarizes mouse and keyboard commands, including key shortcuts for various functions.
Lists grouped alignment procedures for Electron Beam, Ion Beam, Stages, EasyLift, and Others.
Describes how to run alignment procedures automatically and manage progress windows.
Utility to enhance factory calibration accuracy under user-selectable conditions.
Procedure to change apertures when imaging quality is poor.
User-level alignment ensuring electron beam centering, executed regularly.
Set of supervisor-level alignments including sample, aperture, source tilt, image shift, and focus centering.
Procedure to start/stop ion source emission, monitor LMIS status, and heat the Ion Source.
Alignment procedure controlling the ion beam aperture strip holes condition.
Set of stage alignments allowing complete adjustment of the stage and universal holder.
Guidelines for preparing samples, handling them, and using the specimen baking unit.
Covers principles of SEM imaging, magnification, scan speed, contrast, brightness, focusing, and adjustments.
Details standard detectors like ETD, LVD, and Trinity detectors, including their settings and operation.
Describes image capturing, types, file formats, saving, opening, and printing procedures.
Explains how to capture dynamic experiments, movie settings, and use the movie creator.
Covers eucentric position, sample positioning, stage modules, movements, and alignments.
Details patterning processes, types, control modules, and milling techniques.
Provides an overview of cleaning procedures and lists applied cleaners for maintenance.
Details the aperture strip module, including removing and replacing the aperture rod and module.
Explains shutter aperture function, installation, and exchange procedure for protection.
Covers stage mechanics, cleaning stage parts, and recommended cleaning procedures for specimen holders.
Procedure for refilling the water bottle in the instrument, including safety precautions.
Describes the MUI's knobs for controlling magnification, beam shift, focus, and other parameters.
Explains the UPS function for maintaining vacuum during power failures and safe mode procedures.
Details various optional detectors like Trinity, ICE, DBS, GAD, and STEM detectors.
Explains EDX analysis, its use in SEM, and procedures for High Vacuum, Low Vacuum, and STEM EDX.
Covers the EasyLift tool for sample manipulation, module control, and basic procedures like milling.
Details the MEMS heating stage for controlling sample temperature and its installation.
Explains the Beam Deceleration mode, detection principles, and imaging procedures.
Describes the Quick Loader for sample transfer, its description, loading, and unloading procedures.
Details the Plasma Cleaner for contamination removal and sample cleaning procedures.
Covers the Specimen Holder Kit, its components, location positions, and types of holders.
General| Brand | FEI |
|---|---|
| Model | Scios 2 |
| Category | Microscope |
| Language | English |
To Next Page
