Anritsu MS9740B - Chapter 4 Changing Measurement Conditions; Changing Measurement Conditions

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4
Changing Measurement Conditions
Changing Measurement Conditions
Chapter 4
This chapter explains how to change the measurement conditions using
the function keys.
4.1
Wavelength-related Settings ......................................... 4-2
4.2 Setting Level Display .................................................... 4-5
4.3 Changing Data Capturing Method ................................ 4-7
4.4 Displaying Level Peaks and Dips ............................... 4-11
4.5 Analyzing Waveform ................................................... 4-13
4.5.1 Analyzing Single Spectrum Center
Wavelength and Spectrum Width ................... 4-14
4.5.2 Analyzing Single Spectrum SMSR ................. 4-15
4.5.3 Analyzing Multiple Spectrum Center Wavelength
and Spectrum Width (ndB Loss Method) ....... 4-16
4.5.4 Analyzing Multiple Spectrum Center Wavelength
and Spectrum Width (Envelope Method)...... 4-17
4.5.5 Analyzing Multiple Spectrum Center Wavelength
and Spectrum Width (RMS Method) .............. 4-18
4.5.6 Measuring Spectrum Power by Integration .... 4-20
4.5.7 Erasing Analysis Results ................................ 4-21
4.6 Changing Waveform Memory Settings and Calculation
between Memories ..................................................... 4-22
4.7 Changing Measurement Mode ................................... 4-27
4.8 Inputting Title to Waveform Data ................................ 4-31
4.9 Using Light Source Option .......................................... 4-32