H-1
Appendix H
Bibliography
(1) IEC11801
Information technology - Generic cabling for customer
premises
(2) IEC60747-5-3
Discrete semiconductor devices and integrated circuits
- Part 5-3: Optoelectronic devices - Measuring methods
(3) IEC60793-1-44
Optical fibres - Part 1-44: Measurement methods and
test procedures - Cut-off wavelength
(4) IEC60793-1-48
Optical fibres - Part 1-48: Measurement methods and
test procedures - Polarization mode dispersion
(5) IEC60825-1
Safety of laser products. Part 1: Equipment
classification, requirements and user's guide
(6) IEC61010-1
Safety requirements for electrical equipment for
measurement, control, and laboratory use - Part 1:General
requirements
(7) IEC61280-1-3 F
ibre optic communication subsystem basic test
procedures - Part 1-3: Test procedures for general communication
subsystems - Central wavelength and spectral width measurement
(8) IEC61280-2-9
Fibre optic communication subsystem test procedures
- Part 2-9: Digital systems - Optical signal-to-noise ratio
measurement for dense wavelength-division multiplexed systems
(9) IEC61280-4-4
Fibre optic communication subsystem test procedures
- Part 4-4: Cable plants and links - Polarization mode dispersion
measurement for installed links
(10) IEC61290-1-1
Optical amplifiers - Test methods - Part 1-1: Power
and gain parameters - Optical spectrum analyzer method
(11) IEC61290-3-1
Optical amplifiers - Test methods - Part 3-1: Noise
figure parameters - Optical spectrum analyzer method
(12) IEC61290-10-1
Optical amplifiers - Test methods - Part 10-1:
Multichannel parameters - Pulse method using an optical switch and
optical spectrum analyzer
(13) IEC61290-10-4
Optical amplifiers - Test methods - Part 10-4:
Multichannel parameters – Interpolated source subtraction method
using an optical spectrum analyzer
(14) IEC62007-2
Semiconductor optoelectronic devices for fibre optic
system applications - Part 2: Measuring methods
(15) IEC62129
Calibration of optical spectrum analyzers
(16) IEC62150-2
Fibre optic active components and devices - Test and
measurement procedures - Part 2: ATM-PON transceivers