To test the single-clock, multiple-edge, state acquisition
(logic analyzer)
Testing the single-clock, multiple-edge, state acquisition verifies the performance of
the following specifications:
• Minimum master to master clock time.
• Maximum state acquisit ion speed.
• Setup/Hold time for single-clock, multiple-edge, state acquisition.
• Minimum clock pulse width.
This test checks two combinations of data using a multiple-edge single clock at three
selected setup/hold t imes.
Equipment Required
Equipment Critical Specifications Recommended
Model/Part
Pulse Generator 100 MHz 3.5 ns pulse width, < 600 ps rise time HP 8131A option 020
Digitizing Oscilloscope ≥ 6 GHz bandwidth, < 58 ps rise time HP 54121T
Adapter SMA(m)-BNC(f) HP 1250-1200
SMA Coax Cable (Qty 3) 18 GHz bandwidth HP 8120-4948
Coupler BNC(m)(m) HP 1250-0216
BNC Test Connector,
6x2 (Qty 4)
Set up the equipment
11 Turn on the equipment required and the logic analyzer. Let them warm up for
30 minutes before beginning the test if you have not already done so.
22 Set up the pulse generator according to the following table.
Pulse Generator Setup
Channel 1 Channel 2 Period
Doub: 10 ns Delay: 0 ps 20 ns
Width: 4.0 ns Dcyc: 50%
High: − 0.9 V High: − 0.9 V
Low: − 1.7 V Low: − 1.7 V
COMP: Disabled
(LED off)
COMP: Disabled
(LED off)
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