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HP 1660 Series

HP 1660 Series
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Service Guide
Publication number 01660-97002
First edition, August 1993
For Safety information, Warranties, and Regulatory
information, see the pages at the end of the book.
ļ›™ Copyright Hewlett-Packard Company 1987–1993
All Rights Reserved.
HP 1660 Series
Logic Analyzers

Table of Contents

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HP 1660 Series Specifications

General IconGeneral
CategoryLogic Analyzer
Glitch TriggerYes
Pattern TriggerYes
State AnalysisYes
Transitional TimingYes
Trigger ModesEdge, Pattern, Glitch

Summary

HP 1660 Series Logic Analyzers

Notice

Contacting Agilent Sales and Service Offices

Provides contact information for sales and service offices worldwide.

HP 1660 A Series and HP 1660 AS Series Logic Analyzers

Features

Lists the main features of the HP 1660 Series Logic Analyzers, including the oscilloscope capabilities.

Service Strategy

Outlines the service strategy, which is assembly replacement, and suggests returning units to HP for service.

1 General Information

Accessories

Lists accessories supplied with and available for the HP 1660 Series Logic Analyzers.

Specifications (logic analyzer)

Details the performance standards for the logic analyzer functions, including speed and timing.

Specifications (oscilloscope)

Lists the specifications for the oscilloscope functions integrated into the HP 1660AS series.

Recommended Test Equipment (Logic Analyzer)

Lists the equipment recommended for testing the logic analyzer functions.

2 Preparing for Use

To apply power

Steps to safely connect and turn on the logic analyzer, including fuse checks.

To set the line voltage

Procedure for setting the correct line voltage and fuse for instrument operation.

3 Testing Performance

To perform the self-tests

Detailed steps for running built-in diagnostic self-tests for performance verification.

To test the threshold accuracy (logic analyzer)

Procedure to test the accuracy of the logic analyzer's threshold settings across different pods.

To test the glitch capture (logic analyzer)

Test to verify the minimum detectable glitch capability of the logic analyzer.

To test the voltage measurement accuracy (oscilloscope)

Verifies the DC voltage measurement accuracy using dual cursor measurements.

Performance Test Record (logic analyzer)

A template for recording the results of logic analyzer performance tests.

4 Calibrating and Adjusting

To calibrate the oscilloscope

Provides instructions for calibrating the oscilloscope circuitry of the HP 1660AS series.

To adjust the CRT monitor alignment

Steps for adjusting the CRT monitor's alignment using a grid pattern and yoke.

5 Troubleshooting

To use the flowcharts

Explains how to use flowcharts as the primary tool to isolate defective assemblies.

To check the power-up tests

Describes how to check the automatic power-up tests performed by the logic analyzer.

To run the self-tests

Instructions for running various self-tests to identify operational issues.

To test the power supply voltages

Procedure to check the power supply voltages using loaded and unloaded conditions.

6 Replacing Assemblies

To remove and replace the disk drive

Instructions for removing and replacing the internal disk drive.

To remove and replace the power supply

Steps for removing and replacing the instrument's power supply unit.

To remove and replace the CPU board

Procedure for removing and replacing the central processing unit (CPU) board.

To remove and replace the front panel and keyboard

Instructions for removing and replacing the front panel and keyboard assembly.

To return assemblies

Guidance on how to return assemblies to Hewlett-Packard for service or replacement.

7 Replaceable Parts

Replaceable Parts Ordering

Information on how to order replacement parts, including listing and non-listed items.

Replaceable Parts List

A detailed list of all replaceable parts with their designations and HP part numbers.

8 Theory of Operation

Block-Level Theory

Provides a high-level overview of the logic analyzer's block diagram and functions.

Logic Acquisition Board Theory

Explains the theory of operation for the logic acquisition boards.

Self-Tests Description

Describes the different types of self-tests and their purpose.

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