Spectrum Analyzer Measurements 3-16 Spectrum Emission Mask
Spectrum Analyzer MG PN: 10580-00447 Rev. H 3-77
3-16 Spectrum Emission Mask
To select spectral emission mask measurement go to main and menu press MEASURE > MEASUREMENT
>SEM. The SEM measurement parameters are set up using the “SETUP Menu (SEM)” on page 3-81. The
spectrum emission mask (SEM) measurement is a relative measurement method to identify the power level of
out-of-band spurious emissions outside of the in-channel bandwidth signal. The SEM measures the power ratio
between in-band and adjacent channels. The SEM measurement then identifies the emissions that interfere
with other channels. Then, the spurious signal levels of pairs of offset frequencies are identified and related to
the carrier power.
The spectral emission mask measurement supports the testing for “Operating Band Unwanted Emissions”
described in the 3GPP base station conformance testing document. There is support for 5GNR masks which are
automatically built based on the current carrier frequency/channel and BW values. Masks with the (KR)
designation in the title are built according to Korean regulator standards for FR1 signals. The instrument
indicates if the signal is within the specified limits by displaying PASS or FAIL. The emission mask
information is also displayed in a table format with different frequency ranges and whether the signal
PASSED/FAILED in that region.
Selecting the SEM measurement does the following:
• Disables all other measurements
• Adds a predefined 5GNR emission mask
• Sets the span to the mask width
• Sets the detection method to RMS
A spectrum emission mask measurement showing the 5GNR P<38 dBm mask setting is illustrated in
Figure 3-65.
Figure 3-65. SEM Measurement
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