To Next Page

To Previous Page

GEN7iB

227

INPUT CARDS

High potential test

The type tests are performed on a selection of cards to test the design. Every card

produced undergoes a production test to verify that the card has been designed cor-

rectly and that the card is safe. The tests are called “hipot” (high potential) tests (see

Fig. 12.49 and Fig. 12.50).

The tests are performed in two steps to make sure that the channels that are side by

side on the card can withstand the high potential voltages.

1. The inputs of Channel 1, 3 and 5 are tested using a 1500 V RMS common mode

signal with signal negative attached to chassis ground and the inputs of Channel

2, 4 and 6 all connected to chassis ground.

2. The inputs of Channel 2, 4 and 6 are tested using a 1500 V RMS common mode

signal with signal negative attached to chassis ground and the inputs of Channels

1, 3 and 5 all connected to chassis ground.





$'&

,VRODWHGFKDQQHO





$'&

,VRODWHGFKDQQHO

&KDVVLV

9506

&KQ



&KQ

Fig. 12.49 Hipot testing Channels 1, 3 and 5

Questions and Answers:

Need help?

Do you have a question about the HBK GEN7iB GEN Series and is the answer not in the manual?

HBK GEN7iB GEN Series Specifications

General