106 Chapter 9
Measurement Applications (Sample Programs)
Measurement with Auto-sorting System
Measurement with Auto-sorting System
Example 9-2 shows a sample program to measure a capacitor (1 nF), assuming that it is
used in the auto-sorting system integrated with the handler. This program is stored on the
sample program disk under the filename “meas_sys.bas”.
Prepare the auto-sorting system and then start the program. “Set Open-Connection” is
displayed. Bring the measurement terminal of the system (for example, contact probe) to
the OPEN state and press the
[y] key and [Enter] key in this order. The OPEN
compensation data is measured. Then, “Set Short-Connection” is displayed. Bring the
measurement terminal of the system to the SHORT state and press the
[y] key and [Enter]
key in this order. The SHORT compensation data is measured.
Then, “Input Load(Cp) Value @1kHz” is displayed. According to the on-screen
instructions, enter the Cp value of the LOAD standard (pre-valued working standard) at 1
kHz. In the same way, enter the D value at 1 kHz and the Cp and D values at 1 MHz.
When you finish defining the LOAD standard values, “Set Load-Connection” is displayed.
Connect the working standard to the measurement terminal and press the
[y] key and
[Enter] key in this order. The LOAD compensation data is measured.
When measurement of the compensation data is finished, “Set Dut, then input external
trigger!” is displayed. Connect the DUT to the measurement terminal in the auto-sorting
system and enter an external trigger signal from the handler interface. When the
measurement finishes, the sorting judgment result for the BIN setup (see table below),
measurement status, and measured primary and secondary parameter values are displayed.
Repeat this operation 10 times.
When all 10 measurements are finished, the counts sorted to each BIN are displayed and
the program finishes.
Lower limit value Upper limit value
BIN1 -1% 1%
BIN2 -2% 2%
BIN3 -3% 3%
Secondary parameter 0 0.1
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