Hioki 3174 - Selecting Test Mode and Saved Test Condition

8.5 Selecting test mode and saved test condition
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By saving setting values before hand, test conditions can be selected with the
MEM-E and MEM-0 to 3 terminals on the external I/O terminals.
See "Chapter 7 Saving / Loading test conditions" (p. 99)
The follow explains how to load the saved settings from an external I/O.
1. Set the mode to load required saved test conditions.
In READY mode, choose from the chart, “Memory Selection Terminals
and Modes”, the mode required by using MEM3 to MEM0 (22 pin to 25
pin) and set the MEM-E terminal (27 pin) to Lo. After completing the set-
ting, set the MEM-E terminal to Hi.
2. In READY mode, choose from the chart, “Memory Selection Terminals
and Memory Numbers”, the required file number by using MEM3 to
MEM0 and set the MEM-E terminal (27 pin) to Lo. Setting conditions for
the specified file will be loaded. After completing the setting, set the MEM-
E terminal to Hi.
3. When carrying out tests in the W-I mode and I-W mode, set the mode for
required tests following procedure 1.
Memory selection terminal and memory numbers
Memory selection terminal and Mode
8.5 Selecting test mode and
saved test condition
In the Test Mode, test conditions cannot be loaded when W-I mode or I-W mode
is selected. When carrying out tests in the W-I mode and I-W mode, load test
conditions under W-mode and I-mode respectively before setting to W-I mode
and I-W mode.
Memory No.
Memory selection terminal
MEM-3 MEM-2 MEM-1 MEM-0
1
Hi
Hi
Hi
Hi
2
Lo
3
Lo
Hi
4
Lo
5
Lo
Hi
Hi
6
Lo
7
Lo
Hi
8
Lo
Not used
Lo Hi
Hi
Hi
Not used
Lo
Not used
Lo
Hi
Not used
Lo
Mode
Memory selection terminal
MEM-3 MEM-2 MEM-1 MEM-0
W mode
Lo Lo
Hi
Hi
I mode
Lo
W → I mode
Lo
Hi
I → W mode
Lo