Hioki 3174 - 5.2 Starting a Test

4.4 Displaying the Test Result
65
4
Test mode : Insulation-resistance test mode (Retrieve 100 s worth of data
every 0.1 s in RS-232C Communication)
Load : DECADE RESISTANCE BOX DR15510
Capacity load : 0.5 μF, 1.0 μF, 2.0 μF
Range : 2000 M-range (1000 V / 500 V)
400 M, 40 M, 4 M-range (1000 V)
200 M, 20 M, 2 M-range (500 V)
Note: The instrument specifications are specifications for the forward resistance
loads.
The following fluctuations may occur when measuring the capacity loads.
* 2001 M to 2200 M: Outside confirmed range
4.4.3 Influence of capacity on the test result
(reference data)
Test conditions
2000 M-range (output voltage: 1000 V)
Minimum
value (MΩ)
Maximum
value (MΩ)
Minimum
value (MΩ)
Maximum
value (MΩ)
Minimum
value (MΩ)
Maximum
value (MΩ
)
2200
2175
2199(O.F.)
2154
2199(O.F.)
2097
2199(O.F.)
2100
2086
2116
2057
2124
2025
2160
2000
1987
2015
1966
2019
1918
2043
1900
1883
1905
1863
1908
1829
1920
1800
1789
1811
1766
1815
1745
1826
1700
1688
1710
1679
1723
1639
1729
1600
1591
1607
1568
1612
1551
1612
1500
1492
1506
1480
1508
1457
1522
1400
1393
1406
1384
1408
1359
1412
1300
1292
1307
1287
1310
1270
1317
1200
1194
1299
1185
1207
1172
1210
1100
1095
1103
1090
1106
1080
1201
1000
996
1003
989
1003
976
1005
900
895
901
889
900
883
906
350
349
350
348
350
347
350
Resistance
value (MΩ)
Capacitance
0.5
μ
F
1
μ
F
2
μ
F
2000 M-range (output voltage: 500 V)
Minimum
value (MΩ)
Maximum
value (MΩ)
Minimum
value (MΩ)
Maximum
value (MΩ)
Minimum
value (MΩ)
Maximum
value (MΩ
)
2000
1955
1985
1940
1999
1926
2023
1900
1857
1891
1844
1898
1818
1912
1800
1768
1787
1757
1793
1729
1814
1700
1677
1689
1661
1699
1635
1711
1600
1571
1590
1561
1595
1538
1605
1500
1477
1494
1466
1499
1454
1518
1400
1379
1394
1372
1398
1354
1409
1000
990
996
987
998
981
1004
900
890
898
887
898
881
903
800
792
799
791
799
784
801
180
178.8
179.1
178.7
179.1
179.1
180
Resistance
value (MΩ)
Capacitance
0.5
μ
F
1
μ
F
2
μ
F