RFL 9780 RFL Electronics Inc.
April 8, 2003 6-7 (973) 334-3100
Table 6-4. continued - Controls and indicators, RFL 9780 Logic Module
Component
Designator
Name/Description Function For more information
See paragraph:
SW11 Push button Switch Trip reset pushbutton (used with Trip latch
option)
NA
TP1 Test point (Oscillator Y1 Clock frequency of 3.584 MHz. NA
TP2 Test point (Analog Ground) Signal ground NA
TP3 Test point (Digital Ground) Signal ground NA
TP4 Test point (Receive Guard) Guard input from 97 LM/SL NA
TP5 Test point (Receive Trip) Trip input from 97 LM/SL NA
TP6 Test point (Trip Input 1) Monitor solid-state relay keying input #1. NA
TP7 Test point (Trip Input 2) Monitor solid-state relay keying input #2. NA
TP8 Test point (Trip Relay
Output 1)
Received Trip validated by logic module that
drives trip relay.
NA
TP9 Test point (Trip SS Output) Received Trip validated by logic module that
drives solid-state trip relay.
NA
TP10 Test point (Guard Relay
Output)
Received Guard validated by logic module that
drives guard relay.
NA
TP11 Test point (Guard SS
Output)
Received Guard validated by logic module that
drives solid-state guard relay.
NA
TP12 Test point (Trip Relay
Output 2)
Received Trip validated by logic module that
drives Trip relay.
NA
TP13 Test point (Logic Alarm) Logic alarm processed by logic module that
drives Logic alarm relay.
NA
TP14 Test point (Transmitter Fail) Transmitter fail signal received from Power
Amp that drives TX Fail alarm relay.
NA
TP15 Test point (Trip Sent Relay) Trip command keyed. NA
TP16 Test point (Block Out) Block output to Limiter Slicer Module. NA
TP17 Test point (Hi Signal Input) High signal level threshold detector. NA
TP18 Test point (Low Signal
Input)
Low signal level threshold detector. NA
TP19 Test point (CE_Low) Low carrier envelope noise detector. NA
TP20 Test point (CE_High) High carrier envelope noise detector. NA
TP21 Test point (SS IN 1) Optional – not defined. NA
TP22 Test point (SS IN 2) Optional – not defined. NA
To Next Page
Loading...