Zeiss Axio Scope.A1 - Adjusting the Reflected Light;Dark-Field 8

OPERATION
Carl Zeiss Illumination and Contrasting Method Axio Scope.A1
86 M60-2-0007 e 05/08
4.1.8 Adjusting the Reflected Light/Dark-Field
(1) Application
The reflected light/dark-field method is applied when samples are examined which do not have areas
with different reflectivity (ideal bright-field samples), but which show scratches, cracks, pores (brief:
deflections) on the plane surface. All such light scattering details appear bright in the dark-field while the
reflective plane areas remain dark.
(2) Instrumentation
− Axio Scope.A1 with adjusted halogen lamp HAL 100 mounted on the reflected light barrel
− Objectives Epiplan-Neofluar, EC Epiplan-Neofluar, Epiplan with the additional label "HD"
− Reflector module dark-field ACR P&C for reflected light in the reflector turret/slider
(3) Adjusting the reflected light/dark-field
• Adjust the microscope as described in chapter 672H672H4.1.7 for reflected light/bright-field. The field
diaphragm image should lie just barely outside of the edge of the field of view in order to avoid
reflexes.
• Swing reflector module dark-field ACR P&C for reflected light on the reflector turret in the beam path.
• Remove condenser slider 6x20 if mounted.
• Swing in objective position with dark-field objective (HD) on the nosepiece.
• Open aperture diaphragm fully and switch off or remove neutral filters if applicable.
• Put down the sample and adjust the focusing if necessary.