Agilent Technologies 93000 SOC Series - Page 411

Lesson 1 – Test Method Structure
411
For data related to analog module and routing settings, the data
container specifier is two keywords such as follows:
Analog.AWG("Ain").vOffset(0.5 V);
Routing.pin("Ain").connect(TM:SINGLE);
The following show the behavior of these statements.
Behavior of “Analog” Statement
Behavior of “Routing” Statement
To change parameters for a specified analog module or set
conditions for routing, the test method API is used as follows:
DataCategory.Module(parameters).func-1.func-2...;
To get the raw measurement data or the current setting from a
specified module, the test method API is used as follows:
result = DataCategory.Module(parameters).func-1;
Specifier: points to a sub-container of setting data for the
specified module in a data container of primary
analog set for a test suite.
Function: accesses to data in the specified sub-container.
In this example, this function changes the
offset voltage to 0.5 V.
Analog.AWG("Ain").vOffset(0.5 V);
FunctionSpecifier
Analog
Sampling Rate = 1 MHz
Trigger Delay = 0 ns
Offset Voltage = 0.5 V
Filter = 1.3 kHz
Attenuation = 0.70 dB
Start Label = "1kH_Start"
Trigger Line Status = Disable
AWG("Ain")
Specifier: points to a sub-container of setting data for the
specified module in a data container of primary
routing set for a test suite.
Function: accesses to data in the specified sub-container.
In this example, this function sets the connection
conditions for the "Ain" pin.
Routing.pin("Ain").connect(TM::SINGLE);
FunctionSpecifier
Primary = not set
Routing
connect target = "core"
connect mode = SINGLE
:
pin("Ain")