Ambient Conditions
SICAM A8000 / CP-8000 • CP-8021 • CP-8022 Manual Unrestricted 83
DC8-037-2.02, Edition 10.2017
4.4.4 Analog I/Os
Parameter Value Test standard Product standard Class
Dielectrical test (50 Hz)
U ≤ DC 70 V/AC 33 V
1.6 kV
eff
60 s
1.8 kV
eff
5 s
IEC 61010-1 IEC 61010-1
IEC 60870-2-1 >VW2
Impulse voltage 1.2/50 µs
common
2.5 kVp IEC 60255-27 IEC 60870-2-1 >VW2
Impulse voltage 1.2/50 µs
normal
2.5 kVp IEC 60255-27 IEC 60870-2-1 >VW2
Fast transient burst
common
4.0 kVp 5 kHz IEC 61000-4-4 IEC 60870-2-1 3
Fast transient burst (fast
repetition)
4.0 kVp 100 kHz IEC 61000-4-4
Fast transient burst
common
4.0 kVp IEEE C37.90.1
Surge 1.2/50µs
common
2.0 kVp
1)
IEC 61000-4-5 IEC 60870-2-1 4
Surge 1.2/50µs
normal
2.0 kVp IEC 61000-4-5 IEC 60870-2-1 4
Conducted disturbances
(induced HF)
10 V 0.15…80 MHz
80% AM 1 kHz
IEC 61000-4-6
Ring waves 100 kHz
common
2.0 kVp IEC 61000-4-12 IEC 60870-2-1 4
Ring waves 100 kHz
normal
2.0 kVp IEC 61000-4-12 IEC 60870-2-1 4
Conducted common mode
disturbances common
30…3 V
2)
15 Hz…150 kHz
30 V
3)
16⅔/50/60 Hz 60 s
300 V
4)
16⅔/50/60 Hz 1 s
IEC 61000-4-16
Damped oscillatory waves
1 MHz common
2.5 kVp IEC 61000-4-18 IEC 60870-2-1 4
Damped oscillatory waves
1 MHz normal
1.0 kVp IEC 61000-4-18 IEC 60870-2-1 4
Damped oscillatory waves
1 MHz common
2.5 kVp IEEE C37.90.1
1)
AO-8380: tested with 4.0 kVp
2)
AI-8310: tested with 10…1 V
3)
AI-8310: tested with 10 V
4)
AI-8310: tested with 100 V