At this time, put an open-circuit transformer sample with the same pin position as the product under
test on the test fixture, and then press the soft key Meas Open, and the instrument will perform an
open-circuit scan correction on the test fixture. This function can improve the test accuracy of small
inter-turn capacitance and large inductance (>300mH level), and can also improve the open circuit
value of DCR and PS.
High frequency open circuit can improve the test accuracy at high frequency.
[CAL] Turn on the short-circuit test fixture scan correction function:
At this time, put a short-circuit transformer sample with the same pin as the product under test on
the test fixture, and then press the soft key Meas Short, and the instrument will perform
short-circuit scan correction on the test fixture. This function can improve the test accuracy of small
DC resistance and small inductance.
After the open and short correction, if you want to use the clear data in the test, you need to open the
corresponding switch.
7.12.3 PRI page-turning function
In the transformer scan test interface, after testing a transformer with multiple primary windings,
you can switch the primary (PRI) page with the knob to view the test results, and the untested pages
will be ignored directly.
Press the Knob key and the Primary (PRI) page will return to the A1 page.
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