The above is: Above figure shows the short pin setup of the "+" and "-" terminal when example
parallel transformers Ns1 and Ns2 tests.
7.11 <Trans Condition>
This page contains two tables:
The table above is the parameter test condition table, which is mainly used to set the parameters and
test conditions of the transformer under test. The parameters that can be measured are: Turn
(number of turns), Phase (phase), Lx (inductance), Q (quality factor), L.K. (leakage inductance), Cx
(distributed capacitance between turns), D (loss), Zx (Impedance), ACR (AC resistance), DCR (DC
resistance), PS (pin short-circuit detection), BAL (balance). You can also change the scan order of
each parameter and set the test frequency, test voltage, test mode, etc. of each parameter.
The table below is the parameter limit setting table, which is mainly used to set the nominal value
and upper and lower limits of each parameter for sorting.
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