Chapter 7 Transformer Auto Scanning Test
7.1 Introduction to scan test function
TH2840NX can rely on an internal scan board or use an external TH1901/TH1806/TH1831
transformer scan box to form a transformer automatic test system; TH2840AX/TH2840BX can only
use an external scan box to form a test system (no internal scan board).
Note: If there is no functional difference, TH2840X will be used to replace the above three
model descriptions.
At present, the test items that can be provided in the automatic scanning test of transformers include
the number of turns (TURN), phase (PHASING), inductance (Lx), quality factor (Q), leakage
inductance (LK), stray capacitance (Cx), Impedance (Zx), AC impedance (ACR), DC impedance
(DCR), balance (BALANCE), short circuit test (PIN-SHORT) and current bias (DCI-BIAS), etc.
TH2840X can realize the automatic conversion between transformer pins and fixture pins,
automatic test time of rescan interval setup, multi-group primary winding test, multi-group leakage
test, deviation compensation for test values, PASS and FAIL count for test result, save and load
function for test parameter, repeat test for FAIL product, etc. Also, it can test several transformers at
the same time.
7.2 Install and connect the scanning test system
Automatic transformer test system is the connection of TH1901/TH1806/TH2831 and TH2840X,
and the connection steps are as follows:
Use 36PIN double-headed cable (TH26016 transformer test control cable) to connect the
SCANNER socket on the rear panel of TH1901/TH1806/TH2831 and the SCANNER socket on the
rear panel of TH2840X as shown in the following figure.
NOTE: It is forbidden to plug the cable with electricity. Keep the direction of cable be
correctly routed.
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