Tonghui TH2840 Series

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210

Figure 10-13 Comparison result signal output circuit

Main Page

Table of Contents2
Out of Box Audit10
To Inspect the Package10
Power Connection10
Fuse10
Environment10
Use of Test Fixture11
Warm-Up11
Other Features11
Introduction12
Introduction to Front Panel12
Introduction to Rear Panel14
Rear Panel Description 114
Rear Panel Description 216
Introduction to Display Zone17
Main Menu Keys and Corresponding Displayed18
Disp]18
Setup]18
System]19
Basic Operation19
Power on and off19
Description of LCR Function Module21
Meas Display21
Common Test Conditions21
Test Function21
Scaling Position22
Result Display of bin Sort23
Save the Bridge Test Results on the USB Flash Drive24
List Display24
USB Flash Drive Data Save25
Trace Display25
Trigger26
Scale26
Read27
Trace27
USB Flash Drive Data Save29
Other Test Results30
Meas Setup30
Test Function31
Frequency32
Level32
Speed33
Range34
DC Bias34
Level Monitor Function35
Trigger36
Average37
Automatic Level Control37
Source Resistance37
Deviation and Reference38
Limit Setup38
Compare Switch39
Compare Count Switch39
Comparison Function Limit Mode40
Compare Parameters40
Deviations and References40
BIN Switch41
High-Low Limit41
List Setup41
Total Point42
Trigger Mode42
List Mode42
Sweep Condition42
Parameter Function43
High/Low Limit43
Delay43
Trace Setup43
Common Test Conditions44
Sweep Parameters44
Spilt44
Sweep Point45
Sweep Type45
Trace Mode45
Format45
Max-Min46
Ordinate Range Setting46
User Correction46
Open47
Short48
Load49
Load Type50
Cable50
Point Frequency Operation50
System and File52
System Setup52
Mode Setup52
User Setup53
Rs23254
Lan55
Tools56
File57
U-Disk Manage Performance58
Introduction to Store/Recall Function58
Basic Menu Operation of File Management59
Operation Steps for File Management60
Execute LCR Measurement Operation and some Examples62
Correction Operation62
Sweep Correction62
Point-Frequency Correction62
Correct Connection of DUT63
Eliminate the Influence of Stray Impedance64
Operation Example for Testing Inductance65
Test Condition65
Operation Steps65
Operation Example of Testing Capacitance by Multi-Frequency List Sweep66
Test Condition66
Operation Steps66
Operation Example of Load Correction68
Operation Steps68
Note68
Transformer Single-Machine Test69
Circuit for Transformer Single-Machine Test69
Some Parameters of Transformer69
Transformer Single Test Circuit and TURN Test69
Transformer Leakage Inductance Test70
Capacitance Test between Windings of Transformer70
Transformer Single Setup71
Trigger71
Speed71
Test Mode71
Rsou72
Bias Source72
Comp72
Parameter Setup72
Single Display73
Save the Test Results of a Single Set of Transformers on the USB Flash Drive74
Transformer Auto Scanning Test75
Introduction to Scan Test Function75
Install and Connect the Scanning Test System75
Front Panel of Scanning Box76
Rear Panel of Scanning Box78
HANDLER Interface78
Timing Diagram of HANDLER Signal78
Distribution and Connection Diagram for HANDLER78
Example of Transformer79
Clear Settings80
Transformer ID80
Transformer ID81
Primary Nums81
Secondary Nums81
Rescan Interval81
Scan Disp Mode81
Fail Rescan82
Bias on Delay82
Ignore Nom82
Trigger Delay82
Cylinder Ctrl83
Scan Box Mode83
Resistance Source83
Bias Source83
Trans Pin to Fixture84
Pin to Fixture Setup84
Pin Label Setup85
Pin Setup85
Trans Pin Setup86
Series Pins Setup87
Parallel Pins Setup87
Trans Condition88
Frequency, Voltage, Switch and Scanning Sequence89
TURN Test Conditions Setup89
Lx Test Conditions Setup92
Lk Test Conditions Setup95
CX Test Conditions Setup98
Zx Test Conditions Setup101
ACR Test Conditions Setup104
DCR Test Conditions Setup106
PS Test Conditions Setup107
BL Test Conditions Setup109
Handler Mode Function111
Parameter Copy Function111
Statistics Page111
Trans Scan112
Each Display Zone under this Page113
Function Keys under this Page113
PRI Page-Turning Function114
Pin Display Function for Stray Capacitance115
BAL Balance Parameter Display115
File> Page of Transformer Scan116
Transformer Scan Setup File (*.T40)116
Operation Steps for File Manage117
Transformer Deviation-Deduction117
Focus118
Split119
Frequently Asked Questions and Answers in Transformer Scan Test120
High and Low Limits120
Measurement Item Loss120
Measurement Interruption121
Poor DCR Accuracy121
Poor Lk Accuracy121
Inaccurate TURN121
Unstable TURN122
Difference between the First and the Second Lx122
Poor Stability of CX and Zx Open Test Data122
DCR and PS Open Cannot Reach Infinite Large122
User-Made Test Fixture122
Use TH1801-EXT2A-OUT to Make Test Fixture123
Example of Using TH1801-EXT11A(5.0)-B Pin Signal123
Performance and Test125
Test Function125
Parameter and Symbol125
Test Combination126
Mathematical Operation126
Equivalent Mode126
Range126
Trigger126
Delay Time126
Connection Modes of Test Terminals127
Test Speed (Frequency>=10Khz)127
Average127
Display Digit127
Test Signal127
Test Signal Frequency127
Signal Mode127
Test Signal Level128
Output Impedance128
Monitor for Test Signal Level128
Maximum Measurement Display Range128
DC Bias Voltage Source128
Bias Current Source129
Measurement Accuracy129
Accuracy Of│Z│,│Y│, L, C, R, X, G, B129
D Accuracy129
Q Accuracy130
Θ Accuracy130
G Accuracy130
Rp Accuracy130
Rs Accuracy131
DCR Accuracy131
Lk Accuracy131
Turns Ratio Accuracy131
Accuracy Factor132
Safety Requirement135
Insulation Resistance135
Insulation Intensity136
Leakage Current136
Electromagnetic Compatibility136
Performance Test136
Working Condition136
The Used Instruments and Devices136
Function Check137
Test Signal Level137
Frequency137
Measurement Accuracy137
Accuracy of C and D137
Accuracy of L138
Accuracy of Z138
Accuracy of DCR138
Command Reference140
GPIB Common Commands140
SCPI Command141
Display Subsystem Commands143
Frequency Subsystem Commands144
Voltage Subsystem Commands144
Current Subsystem Commands145
Amplitude Subsystem Commands145
Output Subsystem Commands146
BIAS Subsystem Commands146
Trigger Subsystem Commands148
Amplitude Auto Level Subsystem Commands149
Output Resister Internal Resistance Subsystem Commands149
Function Subsystem Commands149
Comparator Subsystem Commands153
LIST Subsystem Commands156
TRACE Subsystem Commands162
Handler Subsystem Commands165
Fetch? Subsystem Commands166
Correction Subsystem Commands168
Mass Memory Subsystem Commands173
TRAN Subsystem Commands175
System System Subsystem Commands180
Modbus Commands185
Command Format185
CRC16 Calculation Method - Look-Up Table Method187
Command Function Comparison Table188
Description for Handler195
Bin Sorting Handler Description195
Technology Description195
Electrical Feature199
Handler Wiring Operation Instructions of bin Sorting202
Using Operations204
List Sweep Handler Description205
List Sweep Sorting Logic205
Technical Description205
Electrical Feature209
List Sweep Sorting Wiring Operation Instructions209
Using Operation209
HANDLER Description of Transformer Single Group Test210
Sorting Logic210
Technical Description210
Electrical Feature212
Handler Wiring Operation Instructions for Transformer Single Measurement213
Using Operation213
Transformer Scan HANDLER Description214
Technical Description214
Electrical Feature216
Handler Wiring Operation Instructions for Transformer Scan220
Using Operation224
Instructions for HANDLER Sorting of Scanning Fixtures224

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