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Tonghui TH2840 Series - Page 6

Tonghui TH2840 Series
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VI
7.12.4 Pin Display Function for Stray Capacitance .................................................... 107
7.12.5 BAL Balance parameter display ....................................................................... 107
7.13 <File> page of Transformer Scan ............................................................................. 108
7.13.1 Transformer scan setup file (*.t40) .................................................................. 108
7.13.2 Operation steps for file manage ....................................................................... 109
7.13.3 Transformer deviation-deduction ..................................................................... 109
7.14 Focus ........................................................................................................................ 110
7.15 Split .......................................................................................................................... 111
7.16 Frequently asked questions and answers in transformer scan test............................ 112
7.16.1 High and low limits .......................................................................................... 112
7.16.2 Measurement item loss ..................................................................................... 112
7.16.3 Measurement interruption ................................................................................ 113
7.16.4 Poor DCR accuracy .......................................................................................... 113
7.16.5 Poor Lk accuracy .............................................................................................. 113
7.16.6 Inaccurate TURN ............................................................................................. 113
7.16.7 Unstable TURN ................................................................................................ 114
7.16.8 Difference between the first and the second Lx ............................................... 114
7.16.9 Poor stability of Cx and Zx open test data ....................................................... 114
7.16.10 DCR and PS open cannot reach infinite large .................................................. 114
7.17 User-made test fixture .............................................................................................. 114
7.17.1 Use TH1801-EXT2A-OUT to make test fixture .............................................. 115
7.17.2 Example of using TH1801-EXT11A(5.0)-B pin signal ................................... 115
Chapter 8 Performance and Test ............................................................................................... 117
8.1 Test function ............................................................................................................. 117
8.1.1 Parameter and symbol ...................................................................................... 117
8.1.2 Test combination .............................................................................................. 118
8.1.3 Mathematical operation .................................................................................... 118
8.1.4 Equivalent mode ............................................................................................... 118
8.1.5 Range ............................................................................................................... 118
8.1.6 Trigger .............................................................................................................. 118
8.1.7 Delay time ........................................................................................................ 118
8.1.8 Connection modes of test terminals ................................................................. 119
8.1.9 Test speed (Frequency>=10kHz) ..................................................................... 119
8.1.10 Average ............................................................................................................ 119
8.1.11 Display digit ..................................................................................................... 119
8.2 Test signal................................................................................................................. 119
8.2.1 Test signal frequency ........................................................................................ 119
8.2.2 Signal mode ...................................................................................................... 119
8.2.3 Test signal level ................................................................................................ 120
8.2.4 Output impedance ............................................................................................ 120
8.2.5 Monitor for test signal level ............................................................................. 120
8.2.6 Maximum measurement display range............................................................. 120
8.2.7 DC bias voltage source ..................................................................................... 120
8.2.8 2A Bias Current Source .................................................................................... 121

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