Name: Agilent Technologies 93000 SOC Series
Brand: Agilent Technologies
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Lesson 4 – Executing the ADC Linearity Test

346

To calculate FS gain error and LSB gain error, the following

formulas are used:

Calculation of ADC Gain Error

Default Chapter3
- Table of Contents3
- Unit11
Lesson13
Training Overview13
- About this Training15
- The Study Material19
Lesson 221
Introduction to the Test System21
- Introduction to the Test System22
- Components of SOC Devices23
- SOC Series Mixed-Signal System Overview25
- Questions33
- Summary and Discussion34
Lesson35
Introduction to the Software35
- Smartest Software Concept Overview37
- Tools for Mixed-Signal Testing39
- Questions54
- Analog Modules55
- Summary and Discussion56
- Unit 257
Analog Hardware57
Lesson 159
Analog Modules59
- Analog Modules60
- Summary of Analog Modules61
- Arbitrary Waveform Generators (AWG)62
- Waveform Digitizer73
- Sampler87
- Time Interval Analyzer94
- Pin Connections with an Analog Module's Multiplexer99
- Multi-Site Baseband Analog Source&Measure / Analog Measure (MCA)104
Lesson104
Addressing the Analog Modules129
- Addressing the Analog Modules130
- Locations of Analog Boards in the Testhead131
- Analog Pins of the Board134
- Identification of Analog Channels in the Software139
Lesson 3143
Synchronization of Analog Modules143
- Synchronization of Analog Modules144
- Synchronization + Triggering146
- Adjusting the Synchronization Timing151
- Unit 3153
DAC Test Setup and Execution153
Lesson 1155
The Training DAC155
- The Training DAC156
- DAC Basics157
- Characteristics of the Training DAC159
- Mixed-Signal Test Setup Procedure161
- Summary and Discussion164
Lesson 2165
Waveform Digitizer Setup with the Analog Setup Tool165
- Waveform Digitizer Setup with the Analog Setup Tool166
- Functions of the Analog Setup Tool167
- Starting the Analog Setup Tool175
- Core Selection and Global Functions177
- Setting up the Analog Hardware181
- Setting up Sequencer Program and Waveform Memory Labels184
- Reviewing and Changing the Waveform Memory192
- Viewing the Relay Multiplexer Switches194
- Summary and Discussion196
Contents197
Lesson 3197
Setting up the Digitizers in the Digital Clock Domain197
- Setting up the Digitizers in the Digital Clock Domain198
- What Is a Clock Domain199
- Clock Sources and Clock Distribution Overview200
- Digital Clock Domain Setup for the Digitizer203
- Summary and Discussion208
Lesson 4209
Defining the Signal Routing209
- Defining the Signal Routing210
- Analog Routing Basics211
- Overview of the Routing Setup Tool213
- Setting up the DAC Routing216
- Activating a Routing Set221
- Viewing the Active Routing222
- Summary and Discussion223
Lesson 5225
Waveform Generation with the Mixed-Signal Tool225
- Functions of the Mixed-Signal Tool227
- Starting the Mixed-Signal Tool229
- Customizing the Mixed-Signal Tool231
- Saving and Restoring Waveforms234
- Generating Waveforms236
- Downloading a Generated Waveform248
- Related Topics250
- Summary and Discussion251
Contents253
Lesson 6253
Executing the DAC Linearity Test253
- Executing the DAC Linearity Test254
- DAC Linearity Measurements255
- DAC Linearity Test Parameters261
- Uploading Result Waveforms with the Mixed-Signal Tool263
- Displaying Logged Waveforms with the Mixed-Signal Tool266
- Related Topics270
- Summary and Discussion271
Lesson 7273
Executing the DAC Distortion Test273
- Executing the DAC Distortion Test274
- DAC Distortion Measurements275
- DAC Distortion Test Parameters280
- Analyzing Spectral Data with the Mixed-Signal Tool282
- Summary and Discussion287
- Unit 4289
ADC Test Setup and Execution289
- The Training ADC290
Lesson 1291
The Training ADC291
- ADC Basics293
- Test Setup Overview for ADC Tests299
- Characteristics of the Training ADC301
- Summary and Discussion302
Lesson 2303
Setting up the Waveform Generator303
- Setting up the Waveform Generator304
- Waveform Generator Setup with Analog Setup Tool305
- Defining and Downloading a Waveform to the AWG317
- Signal Routing320
- Summary and Discussion321
Contents323
Lesson 3323
Setting up the Digital Capturing323
- Setting up the Digital Capturing324
- Introduction to Digital Capture325
- Setup for Digital Capture328
- Summary and Discussion340
Lesson 4341
Executing the ADC Linearity Test341
- Executing the ADC Linearity Test342
- ADC Linearity Measurements343
- ADC Linearity Test Parameters347
- Uploading Result Waveforms with the Mixed-Signal Tool349
- Summary and Discussion351
Lesson 5353
Executing the ADC Distortion Test353
- Executing the ADC Distortion Test354
- ADC Distortion Measurements355
- ADC Distortion Test Parameters357
- Summary and Discussion360
- Unit 5361
Using the Analog Clock Domain361
Lesson 1363
Analog Clock Domain Description363
- Clock Domains Summary365
- Clock Sources and Clock Distribution366
- Clock Distribution between Card Cages370
- Summary and Discussion375
Lesson 2377
Analog Clock Domain Setup377
- Overview of Analog Clock Domain Setup Parameters379
- Analog Clock Domain Setup Procedure382
- Analog Module Setup Interdependencies387
- Summary and Discussion393
Contents395
Using Test Methods395
Test Method Structure397
- Test Method Overview399
- Data Types403
- Input/Output Data of Test Method Program405
- Programming Style of Test Method API409
- Test Method Apis414
- Test Method Program for DC Tests425
Lesson 2431
Creating a Test Method431
- Creating a Test Method432
- Overview433
- Preparations to Develop a Test Method Program436
- Using the Text Editor for Editing a Test Method Program441
- Compiling and Linking Test Method Programs445
- Registering a Test Method Shared Library447
- Setting up Testmethod-Based Test Suite448
- Executing Testmethod-Based Test Suite453
- Debugging Test Method Programs456
- Debugging Tests Using Hardware Response Emulator463
- Unit 7467
Time Interval Analyzer467
Lesson 1469
TIA Overview469
- TIA Overview470
- Front-End Module and Time Interval Analyzer (TIA)471
- Setup and Test Execution Overview473
- TIA Setup474
- Summary and Discussion475
- TIA Setup477
Lesson 2478
TIA Setup478
- Overview479
- Pin Configuration for the TIA480
- Front-End and TIA Setup481
- Defining the Routing493
- Summary and Discussion495
Lesson 3497
TIA Test Method Programming and Test Execution497
- TIA Test Method Programming and Test Execution498
- Test Method Flow499
- TIA API Functions501
- TIA Example Test Method504
  - Summary and Discussion507
  - Multi-Site Test511
Lesson 1512
Multi-Site Test512
- Overview513
- Defining Pin Configuration515
- Setting up Flags for Multi-Site Testing516
- Test Method Program for Multi-Site Testing517
Lesson 2527
DUT Board Design Considerations527
- DUT Board Design Considerations528
- DUT Board Overview529
- DUT Board Design Consideration531
- Grounding and Signal Shielding533
- Printed Circuit Board536
- Troubleshooting Noise Problems539

Brand	Agilent Technologies
Model	93000 SOC Series
Category	Test Equipment
Language	English

Agilent Technologies 93000 SOC Series User Manual

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Agilent Technologies 93000 SOC Series Specifications

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