Agilent Technologies 93000 SOC Series - Page 622

Appendix D
622
TLC5510, TLC5510A
8-BIT HIGH-SPEED ANALOG-TO-DIGITAL CONVERTERS
SLAS095L – SEPTEMBER 1994 – REVISED JUNE 2003
5
POST OFFICE BOX 655303 • DALLAS, TEXAS 75265
operating characteristics at V
DD
= 5 V, V
REFT
= 2.5 V, V
REFB
= 0.5 V, f
(CLK)
= 20 MHz, T
A
= 25°C (unless
otherwise noted)
PARAMETER TEST CONDITIONS MIN TYP MAX UNIT
TLC5510
p
V
I(ANLG)
= 0.5 V – 2.5 V 20 MSPS
f
conv
Maximum conversion rate
TLC5510A
f
I
= 1-kHz ramp
V
I(ANLG)
= 0 V – 4 V 20 MSPS
BW Analog input bandwidth At – 1 dB 14 MHz
t
d(D)
Digital output delay time C
L
≤ 10 pF (see Note 1 and Figure 1) 18 30 ns
Differential gain
NTSC 40 Institute of Radio Engineers (IRE)
1%
Differential phase
modulation wave, f
conv
= 14.3 MSPS
0.7 degrees
t
AJ
Aperture jitter time 30 ps
t
d(s)
Sampling delay time 4 ns
t
en
Enable time, OE↓ to valid data C
L
= 10 pF 5 ns
t
dis
Disable time, OE↑ to high impedance C
L
= 10 pF 7 ns
p
T
A
= 25°C 45
Input tone = 1 MHz
Full range 43
p
T
A
= 25°C 45
p
Input tone = 3 MHz
Full range 46
Spurious free dynamic range (SFDR)
p
T
A
= 25°C 43
dB
Input tone = 6 MHz
Full range 42
p
T
A
= 25°C 39
Input tone = 10 MHz
Full range 39
T
A
= 25°C 46
SNR Signal-to-noise ratio
Full range 44
dB
NOTE 1: C
L
includes probe and jig capacitance.
N
N+1
N+2
N+3
N+4
N–3N–2N–1NN+1
t
d(D)
CLK (clock)
ANALOG IN
(input signal)
D1–D8
(output data)
t
w(H)
t
w(L)
t
d(s)
Figure 1. I/O Timing Diagram