Agilent Technologies 93000 SOC Series User Manual

Lesson 6 – Executing the DAC Linearity Test
262
Test Methodology
This section specifies further processing of the retrieved data
before the actual calculation of results.
• You can specify averaging per point, per waveform, or both.
• You can also specify certain data points and/or whole waveform
cycles to be discarded.
As the number of captured samples is defined with the Analog
Setup Tool, the Analog Setup Tool provides a button labeled
SW AVG/DISC which can be used for calculating the required
number of samples to be taken, when software averaging and
discarding with the testfunction used.
For details see “How to Create a New Waveform Label” on
page 188.
Calculation Parameter
• FSNOM: Here you enter the nominal full scale voltage (V
FS
) of the
DAC.
This parameter is required by the gain error calculations.
Datalog
The DATALOG section provides checkboxes which allow you to
control the storage of captured and calculated waveforms in the
Event Datalog file.

Agilent Technologies 93000 SOC Series Specifications

General

Brand	Agilent Technologies
Model	93000 SOC Series
Category	Test Equipment
Language	English