Tektronix Keithley 4200A-SCS - Test System Connections

Model 4200A-SCS Prober and External Instrument Control Section 8: Set up a probe station
4200A-913-01 Rev. A December 2020 8-15
Figure 128: Sample wafer organization
Test system connections
A typical test system for this tutorial is shown in the following figure. The 4200A-SCS and probe
station are connected to a 7174A matrix card. The matrix card is installed in the switch matrix, and the
switch matrix and probe station are controlled through the GPIB bus.