9. Click on the label name and type in a new description to relabel each subsite.
Figure 285: Relabel the subsites
10. To choose a subsite for testing, select the box at the front of each label. To skip testing the
subsite, clear the box at the front of each label.
11. Click File > Save on the Wafer Map dialog box to save the wafer map.
Use KCon to add a prober
On the 4200A-SCS, use KCon to add the prober to the configuration:
1. Open KCon.
2. At the bottom of the System Configuration list, select Add External Instrument. The Add
External Instrument dialog box is displayed.
Figure 286: Add a prober in KCon