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Lesson 2 – Analog Clock Domain Setup

389

Example 1b: The Fs Value of the WGB gets approximated

The general algorithm for the calculation is to first accept the

direct changes of parameters that affect all modules in the domain.

Then, to find a combination of Clock Value and N values that

fulfills all modules’ rules best, with the highest Clock Value

possible.

If you want to force the Fs value of a module to be generated

precisely, you have to use the Fixed Fs Value rule. This is shown

below.

Default Chapter3
- Table of Contents3
- Unit11
Lesson13
Training Overview13
- About this Training15
- The Study Material19
Lesson 221
Introduction to the Test System21
- Introduction to the Test System22
- Components of SOC Devices23
- SOC Series Mixed-Signal System Overview25
- Questions33
- Summary and Discussion34
Lesson35
Introduction to the Software35
- Smartest Software Concept Overview37
- Tools for Mixed-Signal Testing39
- Questions54
- Analog Modules55
- Summary and Discussion56
- Unit 257
Analog Hardware57
Lesson 159
Analog Modules59
- Analog Modules60
- Summary of Analog Modules61
- Arbitrary Waveform Generators (AWG)62
- Waveform Digitizer73
- Sampler87
- Time Interval Analyzer94
- Pin Connections with an Analog Module's Multiplexer99
- Multi-Site Baseband Analog Source&Measure / Analog Measure (MCA)104
Lesson104
Addressing the Analog Modules129
- Addressing the Analog Modules130
- Locations of Analog Boards in the Testhead131
- Analog Pins of the Board134
- Identification of Analog Channels in the Software139
Lesson 3143
Synchronization of Analog Modules143
- Synchronization of Analog Modules144
- Synchronization + Triggering146
- Adjusting the Synchronization Timing151
- Unit 3153
DAC Test Setup and Execution153
Lesson 1155
The Training DAC155
- The Training DAC156
- DAC Basics157
- Characteristics of the Training DAC159
- Mixed-Signal Test Setup Procedure161
- Summary and Discussion164
Lesson 2165
Waveform Digitizer Setup with the Analog Setup Tool165
- Waveform Digitizer Setup with the Analog Setup Tool166
- Functions of the Analog Setup Tool167
- Starting the Analog Setup Tool175
- Core Selection and Global Functions177
- Setting up the Analog Hardware181
- Setting up Sequencer Program and Waveform Memory Labels184
- Reviewing and Changing the Waveform Memory192
- Viewing the Relay Multiplexer Switches194
- Summary and Discussion196
Contents197
Lesson 3197
Setting up the Digitizers in the Digital Clock Domain197
- Setting up the Digitizers in the Digital Clock Domain198
- What Is a Clock Domain199
- Clock Sources and Clock Distribution Overview200
- Digital Clock Domain Setup for the Digitizer203
- Summary and Discussion208
Lesson 4209
Defining the Signal Routing209
- Defining the Signal Routing210
- Analog Routing Basics211
- Overview of the Routing Setup Tool213
- Setting up the DAC Routing216
- Activating a Routing Set221
- Viewing the Active Routing222
- Summary and Discussion223
Lesson 5225
Waveform Generation with the Mixed-Signal Tool225
- Functions of the Mixed-Signal Tool227
- Starting the Mixed-Signal Tool229
- Customizing the Mixed-Signal Tool231
- Saving and Restoring Waveforms234
- Generating Waveforms236
- Downloading a Generated Waveform248
- Related Topics250
- Summary and Discussion251
Contents253
Lesson 6253
Executing the DAC Linearity Test253
- Executing the DAC Linearity Test254
- DAC Linearity Measurements255
- DAC Linearity Test Parameters261
- Uploading Result Waveforms with the Mixed-Signal Tool263
- Displaying Logged Waveforms with the Mixed-Signal Tool266
- Related Topics270
- Summary and Discussion271
Lesson 7273
Executing the DAC Distortion Test273
- Executing the DAC Distortion Test274
- DAC Distortion Measurements275
- DAC Distortion Test Parameters280
- Analyzing Spectral Data with the Mixed-Signal Tool282
- Summary and Discussion287
- Unit 4289
ADC Test Setup and Execution289
- The Training ADC290
Lesson 1291
The Training ADC291
- ADC Basics293
- Test Setup Overview for ADC Tests299
- Characteristics of the Training ADC301
- Summary and Discussion302
Lesson 2303
Setting up the Waveform Generator303
- Setting up the Waveform Generator304
- Waveform Generator Setup with Analog Setup Tool305
- Defining and Downloading a Waveform to the AWG317
- Signal Routing320
- Summary and Discussion321
Contents323
Lesson 3323
Setting up the Digital Capturing323
- Setting up the Digital Capturing324
- Introduction to Digital Capture325
- Setup for Digital Capture328
- Summary and Discussion340
Lesson 4341
Executing the ADC Linearity Test341
- Executing the ADC Linearity Test342
- ADC Linearity Measurements343
- ADC Linearity Test Parameters347
- Uploading Result Waveforms with the Mixed-Signal Tool349
- Summary and Discussion351
Lesson 5353
Executing the ADC Distortion Test353
- Executing the ADC Distortion Test354
- ADC Distortion Measurements355
- ADC Distortion Test Parameters357
- Summary and Discussion360
- Unit 5361
Using the Analog Clock Domain361
Lesson 1363
Analog Clock Domain Description363
- Clock Domains Summary365
- Clock Sources and Clock Distribution366
- Clock Distribution between Card Cages370
- Summary and Discussion375
Lesson 2377
Analog Clock Domain Setup377
- Overview of Analog Clock Domain Setup Parameters379
- Analog Clock Domain Setup Procedure382
- Analog Module Setup Interdependencies387
- Summary and Discussion393
Contents395
Using Test Methods395
Test Method Structure397
- Test Method Overview399
- Data Types403
- Input/Output Data of Test Method Program405
- Programming Style of Test Method API409
- Test Method Apis414
- Test Method Program for DC Tests425
Lesson 2431
Creating a Test Method431
- Creating a Test Method432
- Overview433
- Preparations to Develop a Test Method Program436
- Using the Text Editor for Editing a Test Method Program441
- Compiling and Linking Test Method Programs445
- Registering a Test Method Shared Library447
- Setting up Testmethod-Based Test Suite448
- Executing Testmethod-Based Test Suite453
- Debugging Test Method Programs456
- Debugging Tests Using Hardware Response Emulator463
- Unit 7467
Time Interval Analyzer467
Lesson 1469
TIA Overview469
- TIA Overview470
- Front-End Module and Time Interval Analyzer (TIA)471
- Setup and Test Execution Overview473
- TIA Setup474
- Summary and Discussion475
- TIA Setup477
Lesson 2478
TIA Setup478
- Overview479
- Pin Configuration for the TIA480
- Front-End and TIA Setup481
- Defining the Routing493
- Summary and Discussion495
Lesson 3497
TIA Test Method Programming and Test Execution497
- TIA Test Method Programming and Test Execution498
- Test Method Flow499
- TIA API Functions501
- TIA Example Test Method504
  - Summary and Discussion507
  - Multi-Site Test511
Lesson 1512
Multi-Site Test512
- Overview513
- Defining Pin Configuration515
- Setting up Flags for Multi-Site Testing516
- Test Method Program for Multi-Site Testing517
Lesson 2527
DUT Board Design Considerations527
- DUT Board Design Considerations528
- DUT Board Overview529
- DUT Board Design Consideration531
- Grounding and Signal Shielding533
- Printed Circuit Board536
- Troubleshooting Noise Problems539

Brand	Agilent Technologies
Model	93000 SOC Series
Category	Test Equipment
Language	English

Agilent Technologies 93000 SOC Series User Manual

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