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Tektronix Keithley 4200A-SCS User Manual

Tektronix Keithley 4200A-SCS
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Model 4200A-SCS Prober and External Instrument Control Section 13: Using a Signatone CM500 Prober
4200A-913-01 Rev. A December 2020 13-17
5. Select the prober-contact_1 action.
6. Rename the action prober-separate.
7. Select Configure.
8. Set chuckposition to 0. This moves the Z chuck to the down (separate) position.
9. Select the prober-contact action.
10. Set chuckposition to 1. This moves the Z chuck to the contact position.
11. Place the prober-separate action at the bottom of the project tree.
12. Right-click prober-separate and select Promote Action twice so that prober-separate is at
the site level.
Figure 322: New prober-separate UTM
The position of the action in the project tree determines when the action is run during a test. For
example, in a device with multiple tests, you can run the device level directly. The tests under that
device are executed sequentially. If an action is under the device level, the action runs in sequence
with the tests. Similarly, actions under the subsite, site, or project levels execute automatically when
the subsite, site, or project is run.
Create a test in the subsite level:
1. Choose Select.
2. Choose the Tests library.
3. Select a test for the device on your wafer.
4. Add the test to the subsite. When you add a test, an appropriate device is automatically added.
You can also add a device from the Devices library and then add a test to the device.
5. Choose the Actions library.

Table of Contents

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Tektronix Keithley 4200A-SCS Specifications

General IconGeneral
BrandTektronix
ModelKeithley 4200A-SCS
CategoryMeasuring Instruments
LanguageEnglish

Summary

Safety Precautions

General Safety Precautions

Essential safety guidelines for operating the instrument and associated equipment.

Electrical Shock Hazards

Details on identifying and avoiding hazardous voltage conditions and electric shock risks.

Using Switch Matrices

Configure and Use a Series 700 Switching System

Update Switch Configuration in KCon

Guide to managing instrumentation configuration using KCon after physical connections.

Set Up Measurements in Clarius

Steps to configure and run tests using the Clarius application with the switching system.

Using a Model 590 C-V Analyzer

Using a Keysight 4284/4980A LCR Meter

Using KCon to Add Keysight LCR Meter

Instructions for adding the Keysight LCR Meter to the 4200A-SCS system configuration.

Using a Model 82 C-V System

Capacitance Measurement Tests

User modules for capacitance testing using the Model 82, including C-t, Simultaneous C-V, and QTsweep.

Simultaneous C-V Measurements

How the 590 and 595 measure capacitance during the same voltage sweep for C-V analysis.

Cable Compensation

Procedure to correct unwanted capacitances by connecting known sources.

Using a Keysight 8110A/8111A Pulse Generator

Using KCon to Add Keysight Pulse Generator

Steps to add the pulse generator to the 4200A-SCS system configuration using KCon.

Set Up a Probe Station

Prober Control Overview

How the 4200A-SCS controls probe stations using GPIB or RS-232 interfaces.

PRBGEN User Library

Prober-control software provided by vendors, accessed via the PRBGEN user modules.

Using a Cascade Microtech PA200 Prober

Using a Micromanipulator 8860 Prober

Using a Cascade Summit-12000 Prober

Using a Signatone CM500 Prober

Using an MPI Probe Station

Probe Station Configuration

Steps to set up and configure the MPI prober for use with the 4200A-SCS.

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