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Agilent Technologies E4406A VSA Series - Page 416

Agilent Technologies E4406A VSA Series
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416 Index
Index
*commands, IEEE, 171
IF flatness adjustment
, 201
IF trigger delay
, 376
IF trigger level
, 376
IF trigger slope
, 377
image filter calibration
, 203
impedance, IQ inputs
, 230
initiate measurement
, 176, 229
input attenuation
, 307
input configuration
, 230
input impedance
, 230
input port selection
, 305
input power
maximum
, 309
range
, 308
input/output
, 167
inputs
configuration
, 363
install application
, 257, 367
Install Now key
, 46
installing measurement
personalities
, 44
instrument
memory functions
, 257
instrument configuration
, 231
instrument firmware updates
, 44
instrument memory
, 258
instrument preset
, 168, 174, 368
instrument states
programming example
, 136
instrument status
, 69, 349
monitoring
, 175
monitoring status monitoring
,
175
instrument-specific errors
positive numbers
, 402
integrity condition register
, 356,
357
integritysignalconditionregister
,
358, 359
internal reference
, 323, 324
internal reference selection
, 305
internet location for information
,
38
internet protocol address
, 363
invert display printout
, 227
invert screen background
, 260
IP
, 168
IP address
, 363
IP, instrument preset
, 368
IQ input impedance
, 230
IQ port selection
, 305
IS-95A
, 321
IS-95B
, 321
IS-95C
, 321
J
Java program
, 115
Java program example
, 158
Java programing socket LAN
, 115
JSTD8
, 321
L
LAN
bus
, 57, 98
C program
, 115
C program example
, 141, 155
cable
, 121
IP address
, 363
Java program
, 115
Java program example
, 158
SICL
, 106
socket programming
, 105
telnet
, 101
using
, 57, 98
VEE program
, 114
LAN defaults
, 57, 116
LAN troubleshooting
, 116
landscape printing
, 225
language reference
, 169
license key
, 367
license key ID
, 366
limit line testing
, 178
limit testing
ACP
, 178
NADC
, 178
PDC
, 178
linking C C with VTL
, 86
list of all commands
, 366
listener
, 93
loading
modes/application
, 257
loading an
application/personality
, 44
local echo, lack of
, 102
LRN, IEEE command
, 173
M
M16QAM
, 320
M64QAM
, 320
markers
, 167, 185
assigning them to traces
, 191
bandpower
, 188
maximum
, 189
minimum
, 190
noise
, 188
off
, 188, 191
programming example
, 127
trace assignment
, 195, 196
turn off
, 188
type
, 190
valid measurement
, 185
value
, 196
value of
, 189
x-axis location
, 195, 196
y-axis
, 196
mass storage
selecting
, 258
mass storage commands
, 258
maximum value of trace data
,
179, 183
meanvalueoftracedata
, 179, 183
measurement
adjacent channel power
, 262
adjacent channel power ratio
,
262
channel power
, 299
commands used
, 166
control of
, 228
controlling commands
, 167
making
, 167
markers
, 185
mode setup
, 167
power statistics CCDF
measurement
, 310
power vs. time
, 312
query current
, 210
selecting modes
, 167
setting it up
, 167
single/continuous
, 228
spectrum (frequency domain)
,
325
waveform (time domain)
, 340
measurement modes
currently available
, 231
selecting
, 231, 232
measurements
adjacent channel power ratio
,
236
CCDF
, 246
channel power
, 245
configuration
, 233
getting results
, 233
power stat
, 246
power vs. time
, 248
spectrum (frequency domain)
,
251
waveform (time domain)
, 255
measurements available in
different modes
, 40
measurment, programming one
,
48
memory available
, 258
memory commands
, 258
memory, instrument commands
,
257
micro base station
, 319
minimum value of trace data
,
179, 183

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