°
Mode 1 (de
fault): t
I
= 0 ms
°
Mode 2: t
I
= 1 ms
°
Mode 3: t
I
= 2 ms
°
Mode 4: t
I
= 3 ms
•
n = set multiple sampling
Preset to n = 2.
Multiple sampling can be changed for the safety laser scanner or for each individ‐
ual f
ield (2 ≤ n ≤ 16).
•
t
O
= t
ime for processing and output
Dependent on output used:
°
O
SSD pair 1: t
O
= 10 ms
°
OSSD pair 2, 3, 4: t
O
= 20 ms
°
EFI-pro: t
O
= 35 ms
Table 38: Response time of an individual safety laser scanner
Scan cycle time (t
S
) Interference protec‐
t
ion (t
I
)
Output (t
O
) t
R
= response time for
multiple sampling n
30 ms Mode 1 0 ms OSSD pair 1 n × 30 ms + 10 ms
OSSD pair 2, 3, 4 n × 30 ms + 20 ms
EFI-pro n × 30 ms + 35 ms
Mode 2 1 ms OSSD pair 1 n × 31 ms + 10 ms
OSSD pair 2, 3, 4 n × 31 ms + 20 ms
EFI-pro n × 31 ms + 35 ms
Mode 3 2 ms OSSD pair 1 n × 32 ms + 10 ms
OSSD pair 2, 3, 4 n × 32 ms + 20 ms
EFI-pro n × 32 ms + 35 ms
Mode 4 3 ms OSSD pair 1 n × 33 ms + 10 ms
OSSD pair 2, 3, 4 n × 33 ms + 20 ms
EFI-pro n × 33 ms + 35 ms
40 ms Mode 1 0 ms OSSD pair 1 n × 40 ms + 10 ms
OSSD pair 2, 3, 4 n × 40 ms + 20 ms
EFI-pro n × 40 ms + 35 ms
Mode 2 1 ms OSSD pair 1 n × 41 ms + 10 ms
OSSD pair 2, 3, 4 n × 41 ms + 20 ms
EFI-pro n × 41 ms + 35 ms
Mode 3 2 ms OSSD pair 1 n × 42 ms + 10 ms
OSSD pair 2, 3, 4 n × 42 ms + 20 ms
EFI-pro n × 42 ms + 35 ms
Mode 4 3 ms OSSD pair 1 n × 43 ms + 10 ms
OSSD pair 2, 3, 4 n × 43 ms + 20 ms
EFI-pro n × 43 ms + 35 ms
50 ms Mode 1 0 ms OSSD pair 1 n × 50 ms + 10 ms
OSSD pair 2, 3, 4 n × 50 ms + 20 ms
EFI-pro n × 50 ms + 35 ms
TECHNICAL DATA 13
8025424/1ELL/2022-01-21 | SICK O P E R A T I N G I N S T R U C T I O N S | microScan3 Pro I/O
187
Subject to change without notice