Because RFL™ and Hubbell® have a policy of continuous product improvement, we reserve the right to change designs and specifications without notice.
2.4.2 T1 TEST JACKS
Each CM4 has two pairs of bantam jacks (T1 IN and T1 OUT) to provide test access to the T1 input
and output signals. Each pair consists of one equipment (EQUIP) jack and one monitor (MON) jack.
The two EQUIP jacks are used for out-of-service testing. The two MON jacks are designed for in-
service testing, so they are equipped with isolation resistors. Because of these resistors, the T1 signals
received and transmitted by the multiplexer can be monitored without significantly affecting their
levels. When terminated by 100 ohms, the signal level at the output of each MON jack, is about 20 dB
below that of the corresponding T1 input or output signal. T1 test sets are designed to automatically
adjust for this attenuation when operated in their monitor (MON) mode.
Table 2-14. T1 test and monitor bantam jacks
Item
(Fig. 2-27)
Module Label Description
8 CM4 T1 OUT EQUIP Provides out-of-service test access to the CM4's T1 output. When
in use, this jack disconnects the CM4's T1 transmitter from the
T1 I/O connector on its Module Adapter.
T1 OUT MON Used for in-service, non-intrusive (resistor-isolated) monitoring of
the CM4's T1 output.
9 CM4 T1 IN EQUIP Provides out-of-service test access to the T1 signal received by the
CM4. When in use, this jack disconnects the CM4's T1 receiver
from the T1 I/O connector on its Module Adapter.
T1 IN MON Used for in-service, non-intrusive (resistor-isolated) monitoring of
the T1 signal received by the CM4.
M-DACS-T1 RFL Electronics Inc.
October 16, 2012 2-52 (973) 334-3100
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