10-8 Chapter 10
Service Key Menus and Error Messages
Service Key Menus
Test Descriptions
The analyzer has up to 80 routines that test, verify, and adjust the instrument. This
section describes those tests.
Internal Tests This group of tests runs without external connections or operator
interaction. All return a PASS or FAIL condition. All of these tests run on power-up and
except as noted.
Table 10-5 Internal Tests
Test
Number
Test Name Description
0 ALL INT Runs only when selected. It consists of internal tests 3–11, 13–16, and 20. Use
the front panel knob to scroll through the tests and see which failed. If all pass,
the test displays a PASS status. Each test in the subset retains its own test
status.
1 PRESET Runs the following subset of internal tests: first, the ROM/RAM tests 2, 3, and
4; then tests 5–11, 14, 15, and 16. If any of these tests fail, this test returns a
FAIL status. Use the front panel knob to scroll through the tests and see which
failed. If all pass, this test displays a PASS status. Each test in the subset
retains its own test status. This same subset is available over GPIB as “TST?”.
It is not performed upon remote preset.
2ROM
Part of the ROM/RAM tests and cannot be run separately. Refer to
Chapter 6 ,
“Digital Control Troubleshooting,”
for more information.
3 SRAM RAM Verifies the A9 CPU SRAM (long-term) memory with a non-destructive
write/read pattern. A destructive version that writes over stored data at
power-on can be enabled by changing the 4th switch position of the A9 CPU
switch as shown below.
4 Main DRAM Verifies the A9 CPU main memory (DRAM) with a non-destructive write/read
test pattern. A destructive version of this test is run during power-on. For
additional information, see
Chapter 6 , “Digital Control Troubleshooting.”
To Next Page
Loading...
Need help?
General
