Chapter 6 How to Operate Sampling Scope
6-82
Measuring Waveform
6.9
The waveform measurement methods are as follows. For the explanation
of the measurement items, refer to 1.5 “Technical Terms”.
● Amplitude and time measurements
Select the measurement items from the following:
For NRZ
One Level, Zero Level, Eye Amplitude, Eye Height, Eye Height
(Ratio), Crossing, SNR, Average Power (dBm), Average Power (mW),
Extinction Ratio, Jitter P-P, Jitter RMS, Rise Time, Fall Time, Eye
Width, DCD, OMA (mW), OMA (dBm), OMA at Crossing, VECP,
TDEC, RIN OMA*
The Average Power (dBm), Average Power (mW), Extinction Ratio,
OMA (mW), OMA (dBm), OMA at Crossing, VECP, and RIN OMA can
be measured when the input is optical.
When the MP2110A-095 is installed, the RIN OMA can be measured.
For PAM4
TDECQ*, Outer OMA (dBm), Outer OMA (µW), Outer ExR,
Linearity, Ceq, Partial TDECQ*, Levels, Levels RMS, Levels P-P,
Level Skews, Eye Levels, Eye Skews, Eye Heights, Eye Widths,
Transition Time (Rise/Fall)*, Transition Time (Slow)*,
Over/Under-shoot, P-P Power*
When Average Power (dBm), Average Power (mW), and RIN OMA are
added as NRZ measurement items, they are measured as well in
PAM4 mode.
TDECQ, Outer OMA (dBm), Outer OMA (µW), Outer ExR, Ceq,
Partial TDECQ, Average Power (dBm), Average Power (mW),
Transition Time (Rise/Fall), Transition Time (Slow),
Over/Under-shoot, and P-P Power can be measured when the input is
optical.
*: Indicates the item that can be measured when Sampling Mode is
Coherent Eye and Test Pattern is other than Variable.
● Jitter analysis
For Eye
TJ, DJ (d-d), RJ (d-d), J2 Jitter, J4 Jitter, J9 Jitter, Eye Opening
For Advanced Jitter
TJ, DJ (d-d), RJ (d-d), J2 Jitter, J4 Jitter, J9 Jitter, Eye Opening,
DDPWS, RJ (rms), PJ (p-p), DDJ (p-p), DCD, ISI (p-p), PJ Frequency
● Mask test
For NRZ, sets the mask pattern and mask margin, and then
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