6 BASIC INSTRUCTIONS
6.4 Bit Processing Instructions
237
6
Performing a 16-bit test
TEST(P)
These instructions take bit data at position specified by (s2) from device specified by (s1) and write to bit device specified by
(d).
■Descriptions, ranges, and data types
■Applicable devices
• These instructions take bit data at position specified by (s2) from device specified by (s1) and write to bit device specified
by (d).
• If relevant bit is "0", device specified by (d) is turned OFF, and if it is "1", device is turned ON.
• For (s2) specify the bit position (0 to 15) of word data. If 16 or more is specified for (s2), the value of the remainder of
(s2)16 is the bit position.
For (s2) = 18, the remainder for 1816 is "2", so it becomes data of b2.
There is no operation error.
Ladder diagram Structured text
ENO:=TEST(EN,s1,s2,d);
ENO:=TESTP(EN,s1,s2,d);
Operand Description Range Data type Data type (label)
(s1) Device number where bit data to be extracted is stored 16-bit signed binary ANY16
(s2) Position of bit data to be extracted 0 to 15 16-bit unsigned binary ANY16
(d) Bit device number where extracted bit data is to be stored Bit ANY_BOOL
Operand Bit Word Double word Indirect
specification
Constant Others
X, Y, M, L,
SM, F, B, SB
U\G T, ST,
C, LC
T, ST, C, D,
W, SD, SW, R
U\G Z LC LZ K, H E $
(s1)
(s2)
(d)
(s1)
··· ···b15 b5 b0
(d)
(s2) bit (When (s2)=5)
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