Keysight B2961A/B2962A SCPI Command Reference, Edition 6 5- 13
Error Messages
B2961A/B2962A Specific Error
Error 132 Self-test failed; CPLD access, item; channel n
Failed the CPLD access test specified by item and channel n.
Error 133 Self-test failed; Trigger count, item; channel n
Failed the trigger count test specified by item and channel n.
Error 134 Self-test failed; DAC/ADC, item; channel n
Failed the DAC/ADC test specified by item and channel n.
Error 135 Self-test failed; Loop control, item; channel n
Failed the loop control test specified by item and channel n.
Error 136 Self-test failed; I sense, item; channel n
Failed the current sense test specified by item and channel n.
Error 137 Self-test failed; V sense, item; channel n
Failed the voltage sense test specified by item and channel n.
Error 138 Self-test failed; F-COM comparison, item; channel n
Failed the F-COM comparison test specified by item and channel n.
Error 139 Self-test failed; V switch, item; channel n
Failed the voltage switch test specified by item and channel n.
Error 140 Self-test failed; Temperature sensor, item; channel n
Failed the temperature sensor test specified by item and channel n.
Error 141 Self-test skipped; To recover channel, execute *TST?
Error 142 Self-test failed; SDRAM
Error 201 Not able to perform requested operation
Error 202 Not allowed; Instrument locked by another I/O session
The requested operation is not allowed because the instrument is locked by another
I/O session. The instrument must be unlocked.
To Next Page
Loading...
Need help?
General
