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16.1 Device Monitor Function
16.1.8 Quick test
The quick test operation procedure for monitor devices is described below.
WARNING
Before performing the quick test operations of device monitor (such as turning ON or OFF bit device,
changing the word device current value, changing the settings or current values of the timer or counter),
read through the manual carefully and make yourself familiar with the operation method.
During quick test operation, never change the data of the devices which are used to perform significant
operation for the system. False output or malfunction can cause an accident.
Device monitor
Enable the quick test mode.
(1) Quick test of bit devices (2) Quick test of word devices
Touch
Check that the quick test
operation is enabled.
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