Intel 8253 - Test Circuits

Philips Semiconductors Linear Products Product specification
DAC08 Series8-Bit high-speed multiplying D/A converter
August 31, 1994
720
AC ELECTRICAL CHARACTERISTICS
SYMBOL
PARAMETER
TEST CONDITIONS
DAC08C
DAC08E
DAC08
DAC08H
DAC08A
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
Min Typ Max Min Typ Max Min Typ Max
UNIT
t
S
Settling time
To ± 1/2LSB, all bits
switched on or off,
T
A
=25°C
70 135 70 135 70 135 ns
Propagation delay
t
PLH
Low-to-High T
A
=25°C, each bit. ns
t
PHL
High-to-Low All bits switched 35 60 35 60 35 60
TEST CIRCUITS
Figure 1. Relative Accuracy Test Circuit
CONTROL
LOGIC
DAC-08
REFERENCE DAC
ACCURACY > 0.006%
NE5534
ERROR
OUTPUT
V– V+
–
+
16
14
15 5-12 1 2
4
133
V
REF
R
REF
R
f
R15
Figure 2. Transient Response and Settling Time
FOR SETTLING TIME
MEASUREMENT
(ALL BITS
SWITCHED LOW
TO HIGH)
USE R
L
to GND
FOR TURN OFF
MEASUREMENT
SETTLING TIME
TRANSIENT
RESPONSE
e
IN
2.4V
0.4V
1.0V
0
0
-100mV
1.4V
R
L
= 500Ω
R
L
= 50Ω
PIN 4 TO GND
t
S
= 70ns TYPICAL
TO ±1/2 LSB
t
PHL
= t
PLH
= 10ns
t
PHL
t
PLH
C
O
≤ 25pF
15pF
51
5
6
7
8
9
10
11
12
3
13
14
15
1
2
4
16
DAC-08
V
EE
V
CC
e
IN
e
O
0.1µF
0.1µF
1.0k
1.0k
0.1µF
R
L
+2.0V
DC