Lattice Semiconductor CertusPro-NX Usage Guide

CertusPro-NX SerDes/PCS Usage Guide
Preliminary Technical Note
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Table A. 120. 10GBASE-R Test Pattern Control 0 [rega2]
Field
Name
Access
Width
Reset
Description
[7:5]
tx_sw_pattern
RW
3
3’d0
Defines the square wave repeating pattern of n ones
followed by n zeros, where n is configurable between 4
and 11.
3’d0 – n=4
3’d1 – n=6
3’d2 – n=8
3’d3 – n=11
others – reserved.
[4]
tx_prbs9_en
RW
1
1’b0
Tx PRBS9 Test-Pattern mode. Specifies the PRBS9 Test-
Pattern mode is enabled or disabled.
1’b1 – PRBS9 test-pattern mode on the Tx path is
enabled.
1’b0 – PRBS9 test-pattern mode on the Tx path is
disabled.
[3]
tx_prbs31_en
RW
1
1’b0
Tx PRBS31 Test-Pattern mode. Specifies the PRBS31 Test-
Pattern mode is enabled or disabled.
1’b1 – PRBS31 test-pattern mode on the Tx path is
enabled.
1’b0 – PRBS31 test-pattern mode on the Tx path is
disabled.
[2]
tx_prtp_en
RW
1
1’b0
Tx test pattern. Specifies the Tx test pattern is enabled or
disabled.
1’b1 – transmit test pattern is enabled.
1’b0 – transmit test pattern is disabled.
[1]
tx_prtp_test_sel
RW
1
1’b0
Tx test pattern Selector. Specifies the selected test pattern
on the Tx path.
1’b1 – square wave test pattern
1’b0 – pseudo random test pattern
[0]
tx_prtp_data_sel
RW
1
1’b0
Tx Data pattern Selector. Specifies the selected data
pattern on the Tx path.
1’b1 – Zeros data pattern.
1’b0 – LF data pattern.
Table A. 121. 10GBASE-R Test Pattern Control 1 [rega3]
Field
Name
Access
Width
Reset
Description
[7:4]
reserved
RSVD
4
—
—
[3]
rx_prbs31_en
RW
1
1’b0
Rx PRBS31 Test-Pattern mode. Specifies the PRBS31 Test-
Pattern mode is enabled or disabled.
1’b1 – PRBS31 test-pattern mode on the Rx path is
enabled.
1’b0 – PRBS31 test-pattern mode on the Rx path is
disabled.
[2]
rx_prtp_en
RW
1
1’b0
Rx test pattern. Specifies the Rx test pattern is enabled or
disabled.
1’b1 – receive test pattern is enabled.
1’b0 – receive test pattern is disabled.
[1]
rx_prtp_test_sel
RW
1
1’b0
Rx test pattern Selector. Specifies the selected test pattern
on the Rx path.
1’b1 – square wave test pattern.
1’b0 – pseudo random test pattern.
[0]
rx_prtp_data_sel
RW
1
1’b0
Rx Data pattern Selector. Specifies the selected data
pattern on the Rx path.

Lattice Semiconductor CertusPro-NX Specifications

General

Brand	Lattice Semiconductor
Model	CertusPro-NX
Category	Computer Hardware
Language	English