Hioki 3153 - Timer Section

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11.1 Basic Specifications
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Decision method Window comparator method ( digital setting )
Decision contents UPPER-FAIL : when measured current exceeds the upper-limit setting
PASS : when measured current remains between the upper- / lower-
limit settings for set time
LOWER-FAIL : when the measured current is below the lower-limit setting
Decision process Output to the display, beeper sound, signals to EXT I/O for each decision result
Setting range 0.10 to 9999 MΩ
（
Upper and lower-limit value
）
Setting resolution 0.01 MΩ (0.10 to 9.99 MΩ)
0.1 MΩ (10.0 to 99.9 MΩ)
1MΩ (100 to 9999 MΩ)
11.1.3 Timer Section
Setting range 0.3 to 999 s
Operation ON : Displays the time that is counted down from the start
OFF: Displays the time that has elapsed from the start
Setting resolution 0.1 s
（
0.3 to 99.9 s
）
/1s
（
100 to 999 s
）
Accuracy 0.5% of the setting value
Setting range The ramp-up time and ramp-down time can be set individually in the range of 0.1
s to 99.9 s.
Operation Ramp-up: Increase the voltage up to the set voltage value during the ramp-up
time, prior to the test time.
Ramp-down: Lower the set voltage value during the ramp-down time, following
the test time.
Both are displayed as time counted down from the set time.
Setting resolution 0.1 s
（
0.1 to 99.9 s
）
Accuracy 0.5% of the setting value
Setting range 0.1 to 99.9 s
Operation Sets the delay time as soon as the test timer starts; no screening is performed
in the meantime.
Setting resolution 0.1 s
（
0.1 to 99.9 s
）
Accuracy 0.5% of the setting value
Decision Function
Test Time Timer
Ramp timer (Withstand-voltage test)
Delay Timer (Insulation resistance test)