Hioki 3153 - Chapter 6 Program Mode Testing Method

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A
Flashing
NOTE
Note that the output waveform may be distorted when conducting an AC withstand
voltage test for a voltage-dependent device or object (e.g., ceramic capacitor).
Excessivel
y
lar
g
e distortion ma
y
dama
g
e the device or tested ob
j
ect.
Chapter 6
Program Mode Testing Method
This chapter describes program setting and testing methods in the program
mode.
Read chapter 2, and make the necessary preparations for testing.
Press the
PROG
key to enter program mode. (The lamp above the key
lights.)