MR TAPCON - Performing a Dielectric Test

7 Commissioning
Maschinenfabrik Reinhausen GmbH 202076 3587317/21 ENTAPCON
®
Figure64: Perform a ground test on the G1 PULS DIMENSION QS3.241 assembly
7.1.2 Performing a dielectric test
The device is tested before delivery. Note the following points if you would
like to perform a dielectric test:
NOTICE
Damage to the device!
A dielectric test with a test voltage that is greater than the maximum permit-
ted test voltage can lead to the device being damaged.
► Perform the dielectric test with a test voltage that is less than or equal to
the maximum permitted test voltage.
► Perform the dielectric test using the permitted interfaces only.
Depending on the device configuration, you may only test the assemblies
listed below. You may not test any other assemblies.
Assembly Interfaces Test parameters
Max. test voltage Max. test dura-
tion
Ramp Breaking current
threshold
OT1205(MR/N)
1
N, L 2.2 kV AC 2s 5s >10mA
UI1 N, L
k, l
2.2 kV AC 2s 5s >4mA
UI3 N, L1, L2, L3
k1, l1, k2, l2, k3, l3
2.2 kV AC 2s 5s >4mA
UI5-3, UI5-4 N, L1, L2, L3
k1, l1, k2, l2, k3, l3
2.2 kV AC 2s 5s >4mA