BEAMEX MC4 - Temperature Measurement and Simulation; RTD Measurement and Simulation

Appendix 1, Technical Data
MC4 User Guide 191
Temperature Measurement and Simulation
Available in Temperature/Generate section.
RTD Measurement and Simulation
Common features for RTDs available as standard:
Feature Specification
Temperature
coefficient
< ±0.0015% of resistance / °C outside of 18...28°C
< ±0.0008% of resistance / °F outside of 64.4 ...82.4°F
Supported units °C, °F, K
Measurement
current
Pulsed, 1 mA (0..500 ohm), 0.2 mA (>500 ohm).
Display update rate
(measurement)
3 / second
Max. Resistance
excitation current
(simulation)
5 mA (0 ... 650 ohm)
Iexc*Rsim < 3.25 V (650 ... 4000 ohm)
Pt50  Pt1000
Full Range: -200  850 °C
Sub Range Resolution 1 Year Uncertainty
(1
-200 ... 0 °C 0.01 °C 4-wire measurement:
0.06 °C
Simulation
(2
:
0.1 °C
0 ... 850 °C 0.01 °C 4-wire measurement:
0.06 °C + 0.025 % RDG
Simulation
(2
:
0.10 °C + 0.025 % RDG
Ni 100
Range Resolution 1 Year Uncertainty
(1
-60 ... 180 ° 0.01 °C 4-wire measurement:
0.06 °C
Simulation
(2
:
0.12 °C
1)
Uncertainty includes reference standard uncertainty, hysteresis, nonlinearity,
repeatability and typical long term stability for mentioned period. (k=2)
2)
Specification valid with an excitation current
>0.2 mA (0...400 ohm),
>0.1 mA (400...4000 ohm)