Nano Series GigE Vision Camera On-Semi Sensor Models • 85
Supplemental Usage Notes:
Reduced Operating Temperature: The model C4900 has a reduced maximum temperature
specification (-20°C to +50°C / -4°F to +122°F) as specified in section Genie Nano Common
Specifications. This temperature specification is measured at the front plate. If the camera
temperature is exceeded, the camera’s acquisition or any other camera operation may lock up.
Simply cool and reset the camera to resume normal operation.
Exposer Time Locked during Acquisition: Unlike other Nano models, the Nano C4900 does not
allow exposure time changes during an active acquisition. Freeze the acquisition first, then make
an exposure time change.
Model C4900 Sensor Cosmetic Specifications
Due to the significant engineering design differences of the Rolling Shutter – High Pixel Density
sensor used in the model C4900, its cosmetic specifications are not consistent with the other Nano
models. The following table applies only to the Nano model C4900 (AR1820HS sensor).
Blemish Specification
Maximum Number
of Defects
Blemish Description & Test Condition
(LSB values refer to 10-bit output)
Very Hot Pixel Defect 600
Defined as any single pixel greater than 500 LSBs above the mean
value of the array, with the sensor operated under no illumination.
(Analog gain = 8x; exposure time = 200ms)
Hot Pixel Defect 1500
Defined as any single pixel greater than 300 LSBs above the mean
value of the array, with the sensor operated under no illumination.
(Analog gain = 8x; exposure time = 200ms)
Very Bright Pixel Defect 600
Sensor illuminated to midlevel (450 LSBs to 650 LSBs).
Within a color plane, each pixel is compared to the mean of the
neighboring 11 x 11 pixels. A pixel value 50 percent or more above
the mean is considered a very bright pixel defect.
(Analog gain = 1x; exposure time = 12.5ms)
Bright Pixel Defect 1500
Sensor illuminated to midlevel (450 LSBs to 650 LSBs).
Within a color plane, each pixel is compared to the mean of the
neighboring 11 x 11 pixels. A pixel value 25 percent or more above
the mean is considered a bright pixel defect.
(Analog gain = 1x; exposure time = 12.5ms)
Very Dark Pixel Defect 600 Sensor illuminated to midlevel (450 LSBs to 650 LSBs).
Within a color plane, each pixel is compared to the mean of the
neighboring 11 x 11 pixels. A pixel value 50 percent or more below
the mean is considered a very dark pixel defect.
(Analog gain = 1x; exposure time = 12.5ms)
Dark Pixel Defect 600 Sensor illuminated to midlevel (450 LSBs to 650 LSBs).
Within a color plane, each pixel is compared to the mean of the
neighboring 11 x 11 pixels. A pixel value 25 percent or more below
the mean is considered a dark pixel defect.
(Analog gain = 1x; exposure time = 12.5ms)
Model C4900 – On-Semi AR1820HS sensor Limitations:
• Under conditions combining high sensor temperatures and illumination exceeding (by a factor
of 5 or more) what is required to saturate sensor pixels, the sensor will produce column noise
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