Index
Index Index-3
retrieve correction constant data
from EEPROM backup disk
,
3-35
RF output power (test 47)
, 3-11
sampler magnitude (test 53)
,
3-16
source default (test 44)
, 3-7
source pretune (test 48)
, 3-10
source pretune default (test 45)
,
3-8
unprotected hardware option
numbers
, 3-54
center conductor damage
, 9-4
certificate of calibration
, 2-4
check
1st LO signal at sampler/mixer
,
8-10
4 MHz REF signal
, 8-6
A and B input traces
, 4-17
A and B inputs
, 8-4
A1/A2 front panel
, 6-12
A10 by substitution or signal
examination
, 8-7
A11 phase lock
, 7-28
A12 digital control signals
, 7-18
A13/A14 Fractional-N
, 7-20
A13/A14 fractional-N
, 7-20
A14 Divide-by-N Circuit Check
,
7-23
A14-to-A13 digital control
signals
, 7-23
A15 Preregulator
, 5-10
A3 source and A11 phase lock
,
7-8
A4 sampler/mixer
, 7-8
A7 pulse generator
, 7-25
A8 fuses and voltages
, 5-13
A9 CPU control
, 6-5
accessories error messages
, 4-22
CPU control
, 6-5
digital control
, 4-12
disk drive
, 4-9
fan voltages
, 5-19
FN LO at A12
, 7-16
for a faulty assembly
, 5-11
GPIB systems
, 4-8
line voltage, selector switch,
fuse
, 5-7
motherboard
, 5-12
operating temperature
, 5-12
operation of A9 CPU control
, 6-5
phase lock error message
, 7-6
phase lock error messages
, 4-14
plotter or printer
, 4-8
post regulator voltages
, 5-6
power supply
, 4-11
power up sequence
, 4-12
preregulator LEDs
, 4-11
rear panel LEDs
, 4-11
receiver
, 4-17
receiver error messages
, 4-18
source
, 4-14
the 4 kHz signal
, 8-9
trace with sampler correction
off
, 8-10
YO coil drive with analog bus
,
7-11
check front panel cables
, 6-15
cleaning of connectors
, 1-7
CLEAR LIST
, 10-7
coax cable
, 1-4
codes for analog bus
, 10-43
coefficients
, 11-1
comb tooth at 3 GHz
, 7-26
components related to specific
error terms
, 9-5
compression test
, 2-72, 2-75
configurable test set option
, 1-8
connection techniques
, 1-7
connector, care of
, 1-7
CONTINUE TEST
, 10-6
controller GPIB address
, 4-8
controller troubleshooting
, 4-9
conventions for symbols
, 10-42
correction constants
ADC offset (test 52)
, 3-15
analog bus (test 46)
, 3-9
cavity oscillator frequency (test
54)
, 3-26
display intensity (test 45)
, 6-7
IF amplifier (test 51)
, 3-14
initialize EEPROMs (test 58)
,
3-33
option numbers (test 56)
, 3-32
retrieval from EEPROM backup
disk
, 3-35
RF output power (test 47)
, 3-11
sampler magnitude (test 53)
,
3-16
serial number (test 55)
, 3-31
source default (test 44)
, 3-7
source pretune (test 48)
, 3-10
source pretune default (test 45)
,
3-8
unprotected hardware option
numbers
, 3-54
CORRECTION CONSTANTS
NOT STORED
, 10-44
CORRECTION TURNED OFF
,
10-44
counter
, 10-20
COUNTER OFF
, 10-21
counter readout location
, 10-33
counter, frequency
, 1-3
CPU
digital control
, 12-11
operation check
, 6-5
crosstalk test
, 2-45, 2-127
CURRENT PARAMETER NOT
IN CAL SET
, 10-45
D
damage to center conductors
, 9-4
data that is faulty
, 4-18
DEADLOCK
, 10-45
default correction constants
adjustment for
source
, 3-7
source pretune
, 3-8
DELETE
, 10-7
description of tests
, 10-8
DEVICE
not on, not connect, wrong
addrs
, 10-45
diagnose softkey
, 10-7
diagnostic
error terms
, 11-1
LEDs for A15
, 5-5
of analyzer
, 4-5
routines for phase lock
, 7-30
tests
, 6-16
diagnostics, internal
, 10-3
diagram
8753E
, 4-23
A4 sampler/mixer to phase lock
cable
, 7-8
digital control group
, 6-3
power supply
, 5-4
DIF Control
, 10-9
DIF Counter
, 10-9
digital control
A1 front panel
, 12-11
A10 digital IF
, 12-11
A16 rear panel
, 12-13
A18 display
, 12-12
A19 GSP
, 12-12
A2 front panel processor
, 12-11
A27 inverter
, 12-13
A9 CPU
, 12-11
check
, 4-12
digital signal processor
, 12-12
EEPROM
, 12-12
group block diagram
, 6-3
lines observed using L INTCOP
as trigger
, 8-8
main CPU
, 12-11
main RAM
, 12-11
signals A14-to-A13 check
, 7-23
signals check
, 7-18
signals generated from A14
,
7-24