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Princeton Instruments PI-MAX4 - Swept Gate Experiment [Variable Width, Variable Delay]; Static Gate Experiment [Fixed Width, Fixed Delay]; Figure 6-26: Repetitive Gating Setup Dialog

Princeton Instruments PI-MAX4
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124 PI-MAX
®
4 System Manual Issue 9
6.5.3 Swept Gate Experiment [Variable Width, Variable Delay]
The procedure for conducting a Swept Gate experiment with variable width and variable
delay is the same as that for conducting a Swept Gate experiment with fixed width and
variable delay with the following parameter configuration changes:
Starting Gate Delay value does not equal Ending Gate Delay value;
Starting Gate Width value does not equal Ending Gate Width value.
Refer to Section 6.5.3, Swept Gate Experiment [Variable Width, Variable Delay], for
additional information.
6.5.4 Static Gate Experiment [Fixed Width, Fixed Delay]
The procedure for conducting a Static Gate experiment is similar to that for conducting a
Swept Gate experiment with the following parameter configuration changes:
Gate Mode: Repetitive;
Gate Width and Gate Delay must be entered on the SuperSYNCHRO Timing
expander as shown in Figure 6-26.
Figure 6-26: Repetitive Gating Setup Dialog
Refer to Section 6.5.4, Static Gate Experiment [Fixed Width, Fixed Delay], for additional
information.
4411-0139_0085

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