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Hioki PQ3100 - Viewing Event Details

Hioki PQ3100
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109
Checking Event List
4
Time Time of event
Threshold Threshold value with event (measured value)
Measured
value
Measured value when an event was detected
If a transient overvoltage event occurred, the transient width is also displayed.
Duration Indicates the period after which the reading returned after the threshold value was
exceeded, or the period from IN to OUT.
IN No. Event No. of IN for Event OUT
Worst* Level Worst measured value during event period
Date Indicates the date on which the worst value was detected.
Time Indicates the time at which the worst value was detected.
CH Channel on which the worst value was detected (CH1/CH2/CH3/CH4/
sum)
Times Number of transient overvoltage detected from the transient
overvoltage event IN to the transient overvoltage event OUT (up to
999999 Times)
*: Indicates the worst measured value during event period. For example in the case of voltage drop due to
DIP, the lowest voltage is the worst value.
An SD card is required to be inserted to display the Event list details.
Event data with characters colored in green include event trend data. (p. 112)
When events with multiple differing parameters occur during the same approximately 200 ms period, they are
displayed together as a single event. A list of the multiple parameters is displayed in the “Event list details” at
the right.
When two event IN items occur simultaneously, they will be displayed according to the priority. Two event
OUT items occurring simultaneously are treated in the same manner.
Checking event details
1
Select an event No.
Move the cursor
[F2] (Page up) key, [F3] (Page down) key:
Cursor position can be changed for each page.
[F5] (Latest Event) key:
You can move the cursor to the latest event.
2
When more than one event has occurred
simultaneously, change the event item
to check the event list details.
Switch event item
An SD card is required to be inserted to refresh the displayed details
9
Checking Events (EVENT Screen)

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