Hioki PQ3100 User Manual

Appx.24
Terminology
Appx. 9 Terminology
Active power Power that is consumed doing work.
Active power
demand
The average active power used during a set period of time (usually 30 min).
Apparent power The (vector) power obtained by combining active power and reactive power.
As its name suggests, apparent power expresses the “visible” power and comprises the
product of the RMS voltage and RMS current.
Binary data All data other than text (character) data.
Since the measured data of the instrument is written in binary format, the data cannot
be directly opened in commercially available spreadsheet software. Use the supplied
software to load the data from the instrument to your computer for analysis.
Declared input
voltage (Udin)
The value calculated from the nominal supply voltage using the transformer ratio. The
declared input voltage is dened by IEC61000-4-30.
Declared voltage
(Uref)
The same voltage as the nominal supply voltage (Uc) or the rated voltage (Un) dened by
IEC61000-4-30 .
Declared voltage (Uref) = declared input voltage (Udin) × VT ratio
Dip A short-lived voltage drop caused by the occurrence of a inrush current with a large load,
such as when a motor starts.
When recording voltage and current trends at the power service inlet, you can determine
whether you should look for the cause of the dip inside or outside the building.
If the voltage drops while the building’s current consumption rises, the likely cause lies
inside the building. If the voltage and current are both low, the cause is likely to lie outside
the building.
EN50160 A European power quality standard that denes limit values for supply voltage and other
characteristics.
Obtaining statistics from the instrument data with the supplied application software PQ
One allows standard-compliant evaluation and analysis (version upgrade supported).
Event Power quality parameters are necessary in order to investigate and analyze power
supply issues. These parameters include disturbances such as transients, dips, swells,
interruptions, and frequency uctuations. As a rule, the term “event” refers to the state
detected based on threshold values for which abnormal values and abnormal waveforms
for these parameters have been set.
Events also include the timer and manual event settings that are unrelated to power
quality parameters.
External event
function
Functionality for generating events by detecting a signal input to the instrument’s external
event input terminal and recording measured values and event waveforms at the time of
detection.
In this way, events are generated based on an alarm signal from a device other than the
instrument.
By inputting an operating signal from an external device, an operation start or stop trigger
can be applied in order to record waveforms with the instrument.
Flag A marker used to distinguish unreliable measured values occurring due to disturbances
such as swells, dips, and interruptions.
Flags are recorded as part of the trend record data status information.
The concept is dened by the IEC61000-4-30 standard.
Flicker A disturbance caused by a voltage drop resulting when equipment with a large load starts
up or when a large current ows under a temporary high-load state. For lighting loads,
icker primarily manifests itself as blinking. Electric-discharge lamps such as uorescent
and mercury-vapor lights are particularly prone to the effects of icker.
When temporary dimming of lights due to voltage drop occurs frequently, a ickering effect
that causing an extremely unpleasant visual sensation is produced.
Measurement methods can be broadly divided into IEC icker and ∆V10 icker. In Japan,
the ∆V10 method is most frequently used.
Frequency (1 wave)
(Freq wav)
The frequency of a single waveform. By measuring the frequency (1 wave), it is possible
to monitor frequency uctuations on an interconnected system at a high degree of detail.

Hioki PQ3100 Specifications

General

Brand	Hioki
Model	PQ3100
Category	Measuring Instruments
Language	English