TH2829X Series Operation Manual Chapter 3 Introduction to [MEAS]
The following control parameters can be set on <BIN NO. DISP>.
Compare function ON/OFF (COMP)
There are 2 zones: BIN NO. DISP, COMP. Their detailed information will be
introduced as below.
The following test conditions are displayed in the measurement result/condition
zone. These zones cannot be set on this page but can be set on <MEAS SETUP>,
<MEAS DISP> or <CORRECTION>.
Test function (FUNCA)
Test function (FUNCB)
Test frequency (FREQ)
Test level (LEVEL)
Test range (RANG)
Test speed (SPEED)
DC Bias (DC BIAS)
DC Voltage source (DC SRC)
Open, short and load correction ON/OFF status (CORR)
3.2.1 Comparator function
TH2829X has an inserted compare function which can divide DUT to up to 10 bins
(from BIN1 to BIN9 and BIN OUT). Users can set 9 pairs of primary parameter
limit and one pair of secondary bin limit. If the primary parameter of DUT is within
the range of the bin limit but the secondary parameter is outside of the bin limit,
the DUT will be sorted into the auxiliary bin. When TH2829X has installed an
HANDLER interface, the compare result will be output into the automatic test
system and further realizing auto-sorting test. These limits can only be set on the
<LIMIT TABLE SETUP> page. Users can set the compare function to ON or OFF
in the COMP
zone.
Operation steps for compare function
1) Move the cursor to COMP, the following soft keys will be displayed.
ON
OFF
2) Select one of above soft keys to set the compare function as ON or OFF.
3.3 <BIN COUNT DISP>
Press [DISP] and then select the soft key of BIN COUNT to enter into the <BIN
COUT> page which shows the count of each bin.
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