TH2829X Series Operation Manual Chapter 4 [SYSTEM] and [FILE]
ISO
DEV A
DEV B
REF A
REF B
Control and set parameters on <BIN COUNT DISP> page
BIN COUNT (ON/OFF)
Control and set parameter on <LIMIT TABLE SETUP> page
PARAM (swap parameter)
NOM
MODE (%-TOL/ABS-TOL/SEQ-MODE)
AUX (ON/OFF)
COM (ON/OFF)
High and low limits of each bin
Control and set parameters on <List Sweep Setup> page
List Sweep Mode (SEQ/STEP)
List Sweep Parameter (Frequency/Level/Bias)
Test points of all sweep parameters
High and low limits of all test points, including limit parameters
(LIMIT-DATA A/LIMIT-DATA B)
Page format currently displayed
Control and set parameters on <TRANS TEST SET> page
Transformer sweep test mode (SEQ/ STEP)
Test frequency of turn, inductance, leakage and DCR
Test level of turn, inductance, leakage and DCR
ON/ OFF state of turn, inductance, leakage and DCR
Control and set parameters on <TRANS LIMIT SET > page
Limit mode (ABS/Δ%)
Nominal values of primary winding, secondary winding, inductance,
leakage and DCR
High limits of secondary winding, inductance, leakage and DCR
Low limits of secondary winding, inductance, leakage and DCR
4.2.2 U-disk manage performance
As described above, TH2829X has a standard configuration of USB HOST
interface, so the external U-disk can be used as the memory media. In this
condition, it breaks the memory limit of 200 groups of *.LCR files. Meanwhile
those files can be copied to IBM PC or compatible desk-top computer, laptop with
USB interface to reach the infinite extension.
TH2829X supports the USB memory devices as below:
Meet the USB 1.0/1.1 standard
Capacity: 32MB/256MB/2GB/4GB
File format: FAT16, FAT32 (Format the USB memory on Microsoft Windows